Inventor · disambiguated record
Cheng Yen Weng
Also filed as: WENG CHENG YEN
13 granted patents·95 citations·filing 2008–2014
91Inventor score
Top patents by PatentIndex Score
13 records- 0194US8692571B2Apparatus and method for measuring degradation of CMOS VLSI elementsLAI FANG-SHI JORDAN·Filed 2011·Granted Apr 8, 2014·17 cites·20 claims
- 0293US8134486B2DAC calibrationLAI FANG-SHI JORDAN·Filed 2010·Granted Mar 13, 2012·20 cites·21 claims
- 0390US8223047B2ADC calibrationLAI FANG-SHI JORDAN·Filed 2010·Granted Jul 17, 2012·13 cites·20 claims
- 0485US8279102B2Method and apparatus for analog to digital conversionLAI FANG-SHI JORDAN·Filed 2010·Granted Oct 2, 2012·11 cites·20 claims
- 0584US8416105B2ADC calibration apparatusLAI FANG-SHI JORDAN·Filed 2011·Granted Apr 9, 2013·10 cites·20 claims
- 0681US8493259B2Pipeline analog-to-digital converterLAI FANG-SHI JORDAN·Filed 2011·Granted Jul 23, 2013·8 cites·20 claims
- 0773US8228221B2Method and apparatus for calibrating sigma-delta modulatorLAI FANG-SHI JORDAN·Filed 2010·Granted Jul 24, 2012·5 cites·20 claims
- 0867US9344106B2ADC calibrationTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 17, 2016·2 cites·19 claims
- 0964US8928508B2ADC calibrationLAI FANG-SHI JORDAN·Filed 2012·Granted Jan 6, 2015·2 cites·20 claims
- 1062US8803715B2Sigma delta modulator including digital to analog coverter (DAC) calibrationLAI FANG-SHI JORDAN·Filed 2012·Granted Aug 12, 2014·2 cites·20 claims
- 1157US7893853B2DAC variation-tracking calibrationTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Feb 22, 2011·3 cites·19 claims
- 1250US8441384B2Switched-capacitor circuit with low signal degradationLAI FANG-SHI·Filed 2011·Granted May 14, 2013·2 cites·27 claims
- 1335US8279097B2Background calibration of analog-to-digital convertersLAI FANG-SHI JORDAN·Filed 2010·Granted Oct 2, 2012·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →