Inventor · disambiguated record
Chih-Ta Wu
Also filed as: WU CHIH-TA
22 granted patents·2 pending applications·287 citations·filing 1999–2022
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG11MOSEL VITELIC INC5IND TECH RES INST1TAIWAN SEMICONDUCTOR MFG CO LTD1TIAWAN SEMICONDUCTOR MFG CO LT1
Top patents by PatentIndex Score
24 records- 0191US11975958B2Automatic fluid replacement device and fluid convey jointIND TECH RES INST·Filed 2022·Granted May 7, 2024·3 cites·11 claims
- 0291US6265269B1Method for fabricating a concave bottom oxide in a trenchMOSEL VITELIC INC·Filed 1999·Granted Jul 24, 2001·121 cites·14 claims
- 0385US9418999B2MIM capacitors with improved reliabilityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 16, 2016·6 cites·19 claims
- 0480US6803291B1Method to preserve alignment mark optical integrityTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Oct 12, 2004·32 cites·20 claims
- 0576US7443005B2Lens structures suitable for use in image sensors and method for making the sameTIAWAN SEMICONDUCTOR MFG CO LT·Filed 2004·Granted Oct 28, 2008·24 cites·22 claims
- 0674US7851324B2Method of forming metal-insulator-metal structureTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Dec 14, 2010·4 cites·10 claims
- 0770US6777336B2Method of forming a shallow trench isolation structureTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Aug 17, 2004·13 cites·14 claims
- 0867US7172908B2Magnetic memory cells and manufacturing methodsTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Feb 6, 2007·2 cites·14 claims
- 0959US7180116B2Self-aligned metal electrode to eliminate native oxide effect for metal insulator semiconductor (MIS) capacitorTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 20, 2007·7 cites·21 claims
- 1059US7169713B2Atomic layer deposition (ALD) method with enhanced deposition rateTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jan 30, 2007·6 cites·12 claims
- 1159US6150238AMethod for fabricating a trench isolationMOSEL VITELIC INC·Filed 1999·Granted Nov 21, 2000·30 cites·14 claims
- 1257US7199001B2Method of forming MIM capacitor electrodesTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 3, 2007·7 cites·10 claims
- 1353USD465485SPersonal digital ticketing processorWEB INFORMATION TECHNOLOGY INC·Filed 2001·Granted Nov 12, 2002·10 cites·1 claims
- 1452US8889507B2MIM capacitors with improved reliabilityWU CHIH-TA·Filed 2007·Granted Nov 18, 2014·1 cites·18 claims
- 1552US7554145B2Magnetic memory cells and manufacturing methodsTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Jun 30, 2009·0 cites·13 claims
- 1651US7202130B2Spacer for a split gate flash memory cell and a memory cell employing the sameTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Apr 10, 2007·4 cites·50 claims
- 1747US7622347B2Self-aligned metal electrode to eliminate native oxide effect for metal insulator semiconductor (MIS) capacitorTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Nov 24, 2009·0 cites·27 claims
- 1845US6090725AMethod for preventing bubble defects in BPSG filmMOSEL VITELIC INC·Filed 1999·Granted Jul 18, 2000·15 cites·21 claims
- 1943US11119001B2Machine tool health monitoring methodUNIV NAT CHUNG CHENG·Filed 2020·Granted Sep 14, 2021·0 cites·3 claims
- 2041US7786552B2Semiconductor device having hydrogen-containing layerTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Aug 31, 2010·0 cites·15 claims
- 2137US2005112876A1Method to form a robust TiCI4 based CVD TiN filmFiled 2003·Application pending·0 cites
- 2232US2003011808A1Printable personal digital assistantFiled 2001·Application pending·0 cites
- 2326US6265233B1Method for determining crack limit of film deposited on semiconductor waferMOSEL VITELIC INC·Filed 1999·Granted Jul 24, 2001·2 cites·8 claims
- 2423US6242365B1Method for preventing film deposited on semiconductor wafer from crackingMOSEL VITELIC INC·Filed 1999·Granted Jun 5, 2001·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →