Inventor · disambiguated record
Chin-Cheng Yang
Also filed as: YANG CHIN-CHENG
68 granted patents·11 pending applications·311 citations·filing 1984–2023
98Inventor score
Top patents by PatentIndex Score
79 records- 0198US8383512B2Method for making multilayer connection structureMACRONIX INT CO LTD·Filed 2011·Granted Feb 26, 2013·58 cites·16 claims
- 0296US10446437B2Interlevel connectors in multilevel circuitry, and method for forming the sameMACRONIX INT CO LTD·Filed 2016·Granted Oct 15, 2019·19 cites·10 claims
- 0394US9478546B2LC module layout arrangement for contact opening etch windowsMACRONIX INT CO LTD·Filed 2014·Granted Oct 25, 2016·15 cites·13 claims
- 0493US9941153B1Pad structure and manufacturing method thereofMACRONIX INT CO LTD·Filed 2016·Granted Apr 10, 2018·8 cites·16 claims
- 0592US9425209B1Multilayer 3-D structure with mirror image landing regionsMACRONIX INT CO LTD·Filed 2015·Granted Aug 23, 2016·22 cites·20 claims
- 0691US8835100B2Double patterning by PTD and NTD processYANG CHIN CHENG·Filed 2012·Granted Sep 16, 2014·7 cites·14 claims
- 0787US8012675B2Method of patterning target layer on substrateMACRONIX INT CO LTD·Filed 2008·Granted Sep 6, 2011·11 cites·19 claims
- 0887US7998826B2Method of forming mark in IC-fabricating processMACRONIX INT CO LTD·Filed 2007·Granted Aug 16, 2011·10 cites·6 claims
- 0987US7645546B2Method for determining an overlay correlation setMACRONIX INT CO LTD·Filed 2006·Granted Jan 12, 2010·16 cites·11 claims
- 1084US8530147B2Patterning processYANG CHIN-CHENG·Filed 2007·Granted Sep 10, 2013·7 cites·20 claims
- 1184US8183123B2Method of forming mark in IC-fabricating processYANG CHIN-CHENG·Filed 2011·Granted May 22, 2012·5 cites·11 claims
- 1284US8084872B2Overlay mark, method of checking local aligmnent using the same and method of controlling overlay based on the sameYANG CHIN-CHENG·Filed 2008·Granted Dec 27, 2011·7 cites·19 claims
- 1383US9097975B2Double patterning by PTD and NTD processMACRONIX INT CO LTD·Filed 2014·Granted Aug 4, 2015·3 cites·9 claims
- 1482US9082802B2Wafer centering hardware design and processYANG CHIN CHENG·Filed 2011·Granted Jul 14, 2015·5 cites·25 claims
- 1581US7449792B2Pattern registration mark designs for use in photolithography and methods of using the sameMACRONIX INT CO LTD·Filed 2006·Granted Nov 11, 2008·10 cites·22 claims
- 1680US10153233B1Interconnect structure and fabricating method thereofMACRONIX INT CO LTD·Filed 2017·Granted Dec 11, 2018·3 cites·6 claims
- 1778US7358145B2Method of fabricating shallow trench isolation structureMACRONIX INT CO LTD·Filed 2006·Granted Apr 15, 2008·8 cites·17 claims
- 1877US9412612B2Method of forming semiconductor deviceMACRONIX INT CO LTD·Filed 2014·Granted Aug 9, 2016·3 cites·20 claims
- 1977US8278770B2Overlay markYANG CHIN-CHENG·Filed 2007·Granted Oct 2, 2012·7 cites·9 claims
- 2077US7927960B2Method of improving overlay performance in semiconductor manufactureMACRONIX INT CO LTD·Filed 2006·Granted Apr 19, 2011·6 cites·12 claims
- 2176US7862986B2Patterning processMACRONIX INT CO LTD·Filed 2007·Granted Jan 4, 2011·5 cites·17 claims
- 2276US7684040B2Overlay mark and application thereofMACRONIX INT CO LTD·Filed 2007·Granted Mar 23, 2010·4 cites·22 claims
- 2375US10497566B1Layout design for fanout patterns in self-aligned double patterning processMACRONIX INT CO LTD·Filed 2018·Granted Dec 3, 2019·2 cites·21 claims
- 2475US9269660B2Multilayer connection structureMACRONIX INT CO LTD·Filed 2013·Granted Feb 23, 2016·3 cites·10 claims
- 2572US7566516B2Photomask and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2005·Granted Jul 28, 2009·3 cites·32 claims
- 2670US7952213B2Overlay mark arrangement for reducing overlay shiftMACRONIX INT CO LTD·Filed 2006·Granted May 31, 2011·4 cites·23 claims
- 2770US7611961B2Method for fabricating semiconductor wafer with enhanced alignment performanceMACRONIX INT CO LTD·Filed 2006·Granted Nov 3, 2009·4 cites·15 claims
- 2870US6905899B2Methods for forming a photoresist pattern using an anti-optical proximity effectMACRONIX INT CO LTD·Filed 2003·Granted Jun 14, 2005·12 cites·26 claims
- 2969US9147692B2Method for forming separate narrow lines, method for fabricating memory structure, and product thereofMACRONIX INT CO LTD·Filed 2013·Granted Sep 29, 2015·2 cites·16 claims
- 3069US8999838B2Semiconductor devices and methods of manufacturing the sameYANG CHIN-CHENG·Filed 2011·Granted Apr 7, 2015·2 cites·15 claims
- 3169US7880274B2Method of enabling alignment of wafer in exposure step of IC process after UV-blocking metal layer is formed over the whole waferMACRONIX INT CO LTD·Filed 2007·Granted Feb 1, 2011·3 cites·16 claims
- 3268US7493588B2Mixing and matching method and integration system for providing backup strategries for optical environments and method for operating the sameMACRONIX INT CO LTD·Filed 2005·Granted Feb 17, 2009·2 cites·23 claims
- 3367US9209016B1Coating method and coating systemMACRONIX INT CO LTD·Filed 2014·Granted Dec 8, 2015·1 cites·19 claims
- 3467US7599063B2Method for checking alignment accuracy using overlay markMACRONIX INT CO LTD·Filed 2007·Granted Oct 6, 2009·2 cites·11 claims
- 3566US7563690B2Method for forming shallow trench isolation regionMACRONIX INT CO LTD·Filed 2006·Granted Jul 21, 2009·3 cites·14 claims
- 3666US6983444B2Mask for reducing proximity effectMACRONIX INT CO LTD·Filed 2003·Granted Jan 3, 2006·8 cites·8 claims
- 3765US9396966B1Patterning method and semiconductor structureMACRONIX INT CO LTD·Filed 2014·Granted Jul 19, 2016·1 cites·13 claims
- 3864US12406922B2Semiconductor structure and manufacturing method thereofMACRONIX INT CO LTD·Filed 2022·Granted Sep 2, 2025·0 cites·19 claims
- 3964US8343713B2Method for patterning material layerMACRONIX INT CO LTD·Filed 2008·Granted Jan 1, 2013·2 cites·17 claims
- 4059US2025015012A1Semiconductor integrated circuit, semiconductor device and method for aligning semiconductor integrated circuitsMACRONIX INT CO LTD·Filed 2023·Application pending·0 cites
- 4158US12094814B2Memory device and flash memory device with improved support for staircase regionsMACRONIX INT CO LTD·Filed 2021·Granted Sep 17, 2024·0 cites·20 claims
- 4258US7432605B2Overlay mark, method for forming the same and application thereofMACRONIX INT CO LTD·Filed 2006·Granted Oct 7, 2008·1 cites·22 claims
- 4356US6864185B2Fine line printing by trimming the sidewalls of pre-developed resist imageMACRONIX INT CO LTD·Filed 2003·Granted Mar 8, 2005·4 cites·34 claims
- 4455US2025096147A1Overlay markMACRONIX INT CO LTD·Filed 2023·Application pending·0 cites
- 4554US8835103B2Lithography process and structuresYANG CHIN CHENG·Filed 2012·Granted Sep 16, 2014·0 cites·28 claims
- 4654US2023309299A1Memory device and method of fabricating the sameMACRONIX INT CO LTD·Filed 2022·Application pending·0 cites
- 4753US11901311B2Memory device and manufacturing method thereofMACRONIX INT CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 4852US12205894B2Routing patternMACRONIX INT CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·19 claims
- 4951US10854616B2Semiconductor structure and method forming the sameMACRONIX INT CO LTD·Filed 2019·Granted Dec 1, 2020·0 cites·19 claims
- 5051US7939225B2Mask for controlling line end shortening and corner rounding arising from proximity effectsMACRONIX INT CO LTD·Filed 2008·Granted May 10, 2011·1 cites·12 claims
Showing the top 50 of 79 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →