Inventor · disambiguated record
Chun-Yi Yang
Also filed as: YANG CHUN YI (JADIS) · YANG CHUN-YI
29 granted patents·4 pending applications·103 citations·filing 1999–2025
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD14MACRONIX INT CO LTD11DELL PRODUCTS LP3ANAGLOBE TECH INC2CHENG UEI PREC IND CO LTD1
Top patents by PatentIndex Score
33 records- 0196US12002774B2Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 4, 2024·2 cites·20 claims
- 0296US11444046B2Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 13, 2022·3 cites·20 claims
- 0394US10312207B2Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 4, 2019·7 cites·20 claims
- 0491US2025343181A1Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0588US12424573B2Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 0688US10804231B2Passivation scheme for pad openings and trenchesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 13, 2020·3 cites·20 claims
- 0780US11680978B2GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 20, 2023·1 cites·20 claims
- 0879US9882046B2Ultra high voltage semiconductor device with electrostatic discharge capabilitiesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 30, 2018·2 cites·19 claims
- 0978US9312348B2Ultra high voltage semiconductor device with electrostatic discharge capabilitiesTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Apr 12, 2016·3 cites·20 claims
- 1075US2025060404A1Gan reliability built-in self test (bist) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1174US12163995B2GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
- 1270US11163886B2Information handling system firmware bit error detection and correctionDELL PRODUCTS LP·Filed 2018·Granted Nov 2, 2021·1 cites·16 claims
- 1369US9608060B2Isolation structure for semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 28, 2017·2 cites·18 claims
- 1469US6794253B2Mask ROM structure and method of fabricating the sameMACRONIX INT CO LTD·Filed 2003·Granted Sep 21, 2004·16 cites·25 claims
- 1568US10936460B2Method and apparatus for identifying and reporting faults at an information handling systemDELL PRODUCTS LP·Filed 2018·Granted Mar 2, 2021·1 cites·20 claims
- 1666US7192811B2Read-only memory device coded with selectively insulated gate electrodesMACRONIX INT CO LTD·Filed 2003·Granted Mar 20, 2007·8 cites·24 claims
- 1766US6440803B1Method of fabricating a mask ROM with raised bit-line on each buried bit-lineMACRONIX INT CO LTD·Filed 2002·Granted Aug 27, 2002·10 cites·20 claims
- 1865US10840371B2Ultra high voltage semiconductor device with electrostatic discharge capabilitiesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 17, 2020·0 cites·20 claims
- 1963US6468869B1Method of fabricating mask read only memoryMACRONIX INT CO LTD·Filed 2001·Granted Oct 22, 2002·9 cites·27 claims
- 2062US10558779B2Method of redistribution layer routing for 2.5-dimensional integrated circuit packagesANAGLOBE TECH INC·Filed 2018·Granted Feb 11, 2020·1 cites·20 claims
- 2160US10461183B2Ultra high voltage semiconductor device with electrostatic discharge capabilitiesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 29, 2019·0 cites·20 claims
- 2258US6397377B1Method of performing optical proximity corrections of a photo mask pattern by using a computerMACRONIX INT CO LTD·Filed 1999·Granted May 28, 2002·20 cites·10 claims
- 2358US2009088044A1Interactive intellectual robotic toy and control method of the sameCHENG UEI PREC IND CO LTD·Filed 2007·Application pending·0 cites
- 2457US6849526B2Method of improving device resistanceMACRONIX INT CO LTD·Filed 2004·Granted Feb 1, 2005·6 cites·19 claims
- 2556US11341014B2System and method for generating a hotkey in a pre-boot environmentDELL PRODUCTS LP·Filed 2020·Granted May 24, 2022·0 cites·20 claims
- 2652US7838947B2Read-only memory device coded with selectively insulated gate electrodesMACRONIX INT CO LTD·Filed 2007·Granted Nov 23, 2010·0 cites·8 claims
- 2750US11011462B2Method for forming fuse pad and bond pad of integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 18, 2021·0 cites·11 claims
- 2844US6649526B2Method for implanting and coding a read-only memory with automatic alignment at four cornersMACRONIX INT CO LTD·Filed 2001·Granted Nov 18, 2003·2 cites·14 claims
- 2943US6821684B2Method for fabricating mask ROM with self-aligned codingMACRONIX INT CO LTD·Filed 2002·Granted Nov 23, 2004·2 cites·22 claims
- 3039US6720629B2Structure of a memory device with buried bit lineMACRONIX INT CO LTD·Filed 2002·Granted Apr 13, 2004·1 cites·15 claims
- 3137US9928334B2Redistribution layer routing for integrated fan-out wafer-level chip-scale packagesANAGLOBE TECH INC·Filed 2016·Granted Mar 27, 2018·0 cites·16 claims
- 3236US2003198898A1Method for manufacturing a semiconductor deviceFiled 2002·Application pending·0 cites
- 3331US6166943AMethod of forming a binary code of a ROMMACRONIX INT CO LTD·Filed 1999·Granted Dec 26, 2000·3 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →