Inventor · disambiguated record
Chi W. Yau
Also filed as: YAU CHI · YAU CHI W · YAU CHI WANG
10 granted patents·332 citations·filing 1989–2008
92Inventor score
Top patents by PatentIndex Score
10 records- 0186US5029166AMethod and apparatus for testing circuit boardsAT & T BELL LAB·Filed 1989·Granted Jul 2, 1991·54 cites·21 claims
- 0285US8703330B2Nickel zinc battery designPHILLIPS JEFFREY·Filed 2005·Granted Apr 22, 2014·10 cites·17 claims
- 0383US5673276ABoundary-scan-compliant multi-chip moduleLUCENT TECHNOLOGIES INC·Filed 1996·Granted Sep 30, 1997·62 cites·5 claims
- 0481US5048021AMethod and apparatus for generating control signalsAT & T BELL LAB·Filed 1989·Granted Sep 10, 1991·38 cites·12 claims
- 0570US8940430B2Metallic zinc-based current collectorPHILLIPS JEFFREY·Filed 2008·Granted Jan 27, 2015·2 cites·23 claims
- 0670US5444716ABoundary-scan-based system and method for test and diagnosisAT & T CORP·Filed 1993·Granted Aug 22, 1995·65 cites·8 claims
- 0769US5155732AMethod and apparatus for data transfer to and from devices through a boundary-scan test access portAT & T BELL LAB·Filed 1990·Granted Oct 13, 1992·31 cites·4 claims
- 0867US5027353AMethod for testing interconnectionsAT & T BELL LAB·Filed 1989·Granted Jun 25, 1991·23 cites·3 claims
- 0963US5331274AMethod and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scanAT & T BELL LAB·Filed 1993·Granted Jul 19, 1994·24 cites·8 claims
- 1050US5570374ABuilt-in self-test control networkLUCENT TECHNOLOGIES INC·Filed 1993·Granted Oct 29, 1996·23 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →