Inventor · disambiguated record
Chih-Hsuan Yeh
Also filed as: YEH CHIH-HSUAN
3 granted patents·5 pending applications·0 citations·filing 2022–2025
43Inventor score
Top patents by PatentIndex Score
8 records- 0172US2025273589A1Semiconductor device including mark structure for measuring overlay error and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0270US2025233079A1Method of manufacturing semiconductor device including mark structure for measuring overlay errorNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0368US12463145B2Semiconductor device including mark structure for measuring overlay error and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2023·Granted Nov 4, 2025·0 cites·10 claims
- 0464US2025069946A1Method for fabricating photomask and method for fabricating semiconductor device with damascene structureNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 0559US2024086633A1Method, system and non-transitory storage medium for generating and outputting a message9 RISE INTERNATIONAL MOBILE HEALTH TECH CO LTD·Filed 2023·Application pending·0 cites
- 0652US2023298932A1Method for fabricating photomask and method for fabricating semiconductor device with damascene structureNANYA TECHNOLOGY CORP·Filed 2022·Application pending·0 cites
- 0745US12283518B2Method for fabricating semiconductor device with contact structureNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 22, 2025·0 cites·20 claims
- 0842US12417982B2Semiconductor device with contact structureNANYA TECHNOLOGY CORP·Filed 2022·Granted Sep 16, 2025·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →