Inventor · disambiguated record
Changhyeong Yoon
Also filed as: YOON Changhyeong
3 granted patents·4 pending applications·4 citations·filing 2015–2025
52Inventor score
Top patents by PatentIndex Score
7 records- 0191US12002698B2Metrology apparatus and method based on diffraction using oblique illumination and method of manufacturing semiconductor device using the metrology methodSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jun 4, 2024·4 cites·16 claims
- 0272US2025225674A1Semiconductor measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0361US2023114817A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 0458US2025237861A1Polarizer assembly and spectroscopic ellipsometer including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0555US2025266237A1Reflectance confocal scanning electron microscope and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0650US11624699B2Measurement system capable of adjusting AOI, AOI spread and azimuth of incident lightSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 11, 2023·0 cites·17 claims
- 0729US10383508B2Endoscope, handpiece of endoscope, calibration method therefor, and method for using the sameGWANGJU INST SCIENCE & TECH·Filed 2015·Granted Aug 20, 2019·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →