Inventor · disambiguated record
Clayton C. Williams
Also filed as: WILLIAMS CLAYTON · WILLIAMS CLAYTON C · WILLIAMS CLAYTON COVEY
17 granted patents·2 pending applications·467 citations·filing 1984–2021
94Inventor score
Top patents by PatentIndex Score
19 records- 0194US4747698AScanning thermal profilerIBM·Filed 1986·Granted May 31, 1988·156 cites·21 claims
- 0290US5065103AScanning capacitance - voltage microscopyIBM·Filed 1990·Granted Nov 12, 1991·93 cites·19 claims
- 0390US4947034AApertureless near field optical microscopeIBM·Filed 1989·Granted Aug 7, 1990·71 cites·25 claims
- 0477US10514250B2Interferometry system and associated methodsUNIV UTAH RES FOUND·Filed 2017·Granted Dec 24, 2019·2 cites·36 claims
- 0572US5969345AMicromachined probes for nanometer scale measurements and methods of making such probesUNIV UTAH RES FOUND·Filed 1997·Granted Oct 19, 1999·41 cites·13 claims
- 0670US6583412B2Scanning tunneling charge transfer microscopeUNIV UTAH RES FOUND·Filed 2001·Granted Jun 24, 2003·25 cites·27 claims
- 0768US7420106B2Scanning probe characterization of surfacesUNIV UTAH RES FOUND·Filed 2006·Granted Sep 2, 2008·4 cites·25 claims
- 0868US2022003540A1Interferometry systems and methodsUNIV UTAH RES FOUND·Filed 2021·Application pending·0 cites
- 0967US5061070AParticulate inspection of fluids using interferometric light measurementsIBM·Filed 1988·Granted Oct 29, 1991·26 cites·42 claims
- 1065US8315819B1Method and apparatus for determining dopant density in semiconductor devicesWILLIAMS CLAYTON COVEY·Filed 2009·Granted Nov 20, 2012·3 cites·20 claims
- 1163US11162781B2Interferometry systems and methodsUNIV UTAH RES FOUND·Filed 2019·Granted Nov 2, 2021·0 cites·5 claims
- 1263US11009341B2Interferometry system and associated methodsUNIV UTAH RES FOUND·Filed 2019·Granted May 18, 2021·0 cites·15 claims
- 1356US9052337B2Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopyUNIV UTAH RES FOUND·Filed 2014·Granted Jun 9, 2015·1 cites·10 claims
- 1456US9052339B2Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopyUNIV UTAH RES FOUND·Filed 2014·Granted Jun 9, 2015·1 cites·42 claims
- 1554US10422630B2Interferometry system and associated methodsUNIV UTAH RES FOUND·Filed 2015·Granted Sep 24, 2019·0 cites·12 claims
- 1653US5523700AQuantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopyUNIV UTAH RES FOUND·Filed 1995·Granted Jun 4, 1996·25 cites·4 claims
- 1751US4666308AMethod and apparatus for non-destructive testing using acoustic-optic laser probeUNIV STANFORD·Filed 1984·Granted May 19, 1987·12 cites·7 claims
- 1841US2007174416A1Spatially articulable interface and associated method of controlling an application frameworkFRANCE TELECOM·Filed 2006·Application pending·0 cites
- 1934US6210982B1Method for improving spatial resolution and accuracy in scanning probe microscopyUNIV UTAH RES FOUND·Filed 1998·Granted Apr 3, 2001·7 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →