Inventor · disambiguated record
Costas P. Grigoropoulos
Also filed as: GRIGOROPOULOS COSTAS P
7 granted patents·5 pending applications·262 citations·filing 2000–2025
87Inventor score
Files withUNIV CALIFORNIA5IND TECH RES INST2GRIGOROPOULOS COSTAS P1HITACHI AMERICA LTD1HWANG DAVID JEN1
Top patents by PatentIndex Score
12 records- 0194US7786024B2Selective processing of semiconductor nanowires by polarized visible radiationNANOSYS INC·Filed 2007·Granted Aug 31, 2010·33 cites·13 claims
- 0294US6451631B1Thin film crystal growth by laser annealingHITACHI AMERICA LTD·Filed 2000·Granted Sep 17, 2002·120 cites·14 claims
- 0392US7985367B2Method for producing active glass nanoparticles by laser ablationUNIV CALIFORNIA·Filed 2009·Granted Jul 26, 2011·27 cites·30 claims
- 0492US6635932B2Thin film crystal growth by laser annealingUNIV CALIFORNIA·Filed 2002·Granted Oct 21, 2003·71 cites·4 claims
- 0578US8580130B2Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatusMAO SAMUEL S·Filed 2008·Granted Nov 12, 2013·6 cites·22 claims
- 0673US7994029B2Method for patterning crystalline indium tin oxide using femtosecond laserIND TECH RES INST·Filed 2009·Granted Aug 9, 2011·3 cites·20 claims
- 0767US8728720B2Arbitrary pattern direct nanostructure fabrication methods and systemHWANG DAVID JEN·Filed 2011·Granted May 20, 2014·2 cites·21 claims
- 0859US2025235952A1Broadband emitters for thermal radiative energy transportUNIV CALIFORNIA·Filed 2025·Application pending·0 cites
- 0946US2015064057A1Methods for producing nio nanoparticle thin films and patterning of ni conductors by nio reductive sintering and laser ablationUNIV CALIFORNIA·Filed 2014·Application pending·0 cites
- 1041US2012206722A1High-Resolution Laser Induced Breakdown Spectroscopy Devices and MethodsGRIGOROPOULOS COSTAS P·Filed 2011·Application pending·0 cites
- 1141US2009130427A1Nanomaterial facilitated laser transferUNIV CALIFORNIA·Filed 2008·Application pending·0 cites
- 1238US2007154327A1Controllable capillary pumpIND TECH RES INST·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →