Inventor · disambiguated record
Craig A. Scheer
Also filed as: SCHEER CRAIG A
4 granted patents·1 pending application·215 citations·filing 1996–2004
81Inventor score
Top patents by PatentIndex Score
5 records- 0187US6169601B1Method and apparatus for distinguishing particles from subsurface defects on a substrate using polarized lightADE OPTICAL SYSTEMS·Filed 1999·Granted Jan 2, 2001·120 cites·20 claims
- 0277US6091493AProcess for particle size measurementSCATTER WORKS INC·Filed 1999·Granted Jul 18, 2000·53 cites·34 claims
- 0368US6833028B1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2002·Granted Dec 21, 2004·11 cites·15 claims
- 0464US5659388AMethod and apparatus for operating a condensation nucleus counter with improved counting stability and accuracy over a variable detection thresholdVLSI STANDARDS INC·Filed 1996·Granted Aug 19, 1997·31 cites·15 claims
- 0541US2005118332A1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →