Inventor · disambiguated record
Curtis M. Medlen
Also filed as: MEDLEN CURTIS M
9 granted patents·565 citations·filing 1997–2001
91Inventor score
Files withMICRON TECHNOLOGY INC9
Top patents by PatentIndex Score
9 records- 0198US6167614B1Method of manufacturing and testing an electronic device, and an electronic deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 2, 2001·411 cites·21 claims
- 0294US6509256B2Methods of forming electrically conductive interconnections and electrically interconnected substratesMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 21, 2003·77 cites·26 claims
- 0374US6344792B1Method of manufacturing and testing an electronic device, and a electronic deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 5, 2002·12 cites·24 claims
- 0465US6104280AMethod of manufacturing and testing an electronic device, and an electronic deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 15, 2000·17 cites·6 claims
- 0555US6359561B2Method of manufacturing and testing an electronic device, and an electronic deviceMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 19, 2002·4 cites·17 claims
- 0655US6143639AMethods of forming electrically conductive interconnections and electrically interconnected substratesMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 7, 2000·14 cites·35 claims
- 0755US6110760AMethods of forming electrically conductive interconnections and electrically interconnected substratesMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 29, 2000·14 cites·19 claims
- 0848US6271597B1Methods for forming electrically conductive interconnections and electrically interconnected substratesMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 7, 2001·10 cites·24 claims
- 0943US6211785B1Method of manufacturing and testing an electronic device, and an electronic deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 3, 2001·6 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →