Inventor · disambiguated record
D. Kurt Gaskill
Also filed as: GASKILL D KURT
3 granted patents·87 citations·filing 1988–2015
72Inventor score
Top patents by PatentIndex Score
3 records- 0171US5379109AMethod and apparatus for non-destructively measuring local resistivity of semiconductorsUS ARMY·Filed 1992·Granted Jan 3, 1995·62 cites·20 claims
- 0269US10562278B2Multilayer graphene structures with enhanced mechanical properties resulting from deterministic control of interlayer twist angles and chemical functionalizationUNIV MASSACHUSETTS·Filed 2015·Granted Feb 18, 2020·1 cites·8 claims
- 0361US4953983ANon-destructively measuring local carrier concentration and gap energy in a semiconductorBOTTKA NICHOLAS·Filed 1988·Granted Sep 4, 1990·24 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →