Inventor · disambiguated record
David H. Allen
Also filed as: ALLEN DAVID H · ALLEN DAVID HOWARD · ALLEN DAVID P
55 granted patents·3 pending applications·2,204 citations·filing 1978–2024
99Inventor score
Top patents by PatentIndex Score
58 records- 0198US5365551AData communication transceiver using identification protocolMICRON TECHNOLOGY INC·Filed 1992·Granted Nov 15, 1994·438 cites·51 claims
- 0297US5500650AData communication method using identification protocolMICRON TECHNOLOGY INC·Filed 1992·Granted Mar 19, 1996·298 cites·19 claims
- 0396US5583850AData communication system using identification protocolMICRON TECHNOLOGY INC·Filed 1994·Granted Dec 10, 1996·256 cites·9 claims
- 0493US6504212B1Method and apparatus for enhanced SOI passgate operationsIBM·Filed 2000·Granted Jan 7, 2003·85 cites·16 claims
- 0592US6429689B1Method and apparatus for controlling both active and standby power in domino circuitsIBM·Filed 2001·Granted Aug 6, 2002·46 cites·20 claims
- 0692US6002292AMethod and apparatus to control noise in a dynamic circuitIBM·Filed 1998·Granted Dec 14, 1999·77 cites·16 claims
- 0792US4218933ARack and pinion gear assemblyCAM GEARS LTD·Filed 1978·Granted Aug 26, 1980·56 cites·19 claims
- 0891US6222394B1SOI CMOS sense amplifier with enhanced matching characteristics and sense point toleranceIBM·Filed 2000·Granted Apr 24, 2001·57 cites·13 claims
- 0991US5841770AData communication system using indentification protocolMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 24, 1998·197 cites·25 claims
- 1091US5627544AData communication method using identification protocolMICRON TECHNOLOGY INC·Filed 1996·Granted May 6, 1997·213 cites·53 claims
- 1190US4912709AFlexible VLSI on-chip maintenance and test system with unit I/O cell designCONTROL DATA CORP·Filed 1987·Granted Mar 27, 1990·78 cites·15 claims
- 1287US7170811B1Separate variable power supply to on-chip memory using existing power suppliesIBM·Filed 2005·Granted Jan 30, 2007·19 cites·14 claims
- 1384US5135889AMethod for forming a shielding structure for decoupling signal traces in a semiconductorMICRON TECHNOLOGY INC·Filed 1991·Granted Aug 4, 1992·75 cites·13 claims
- 1482US7528646B2Electrically programmable fuse sense circuitIBM·Filed 2006·Granted May 5, 2009·14 cites·1 claims
- 1581US5878055AMethod and apparatus for verifying a single phase clocking system including testing for latch early modeIBM·Filed 1997·Granted Mar 2, 1999·46 cites·11 claims
- 1680US8809156B1Method for implementing deep trench enabled high current capable bipolar transistor for current switching and output driver applicationsIBM·Filed 2013·Granted Aug 19, 2014·5 cites·13 claims
- 1778US7954000B2Power supply current spike reduction techniques for an integrated circuitIBM·Filed 2008·Granted May 31, 2011·9 cites·14 claims
- 1876US7092281B1Method and apparatus for reducing soft error rate in SRAM arrays using elevated SRAM voltage during periods of low activityIBM·Filed 2005·Granted Aug 15, 2006·9 cites·21 claims
- 1973US8515590B2Fan speed control from adaptive voltage supplySINGH DEEPAK K·Filed 2012·Granted Aug 20, 2013·2 cites·4 claims
- 2072US7865750B2Fan speed control from adaptive voltage supplyIBM·Filed 2007·Granted Jan 4, 2011·4 cites·9 claims
- 2171US7489572B2Method for implementing eFuse sense amplifier testing without blowing the eFuseIBM·Filed 2007·Granted Feb 10, 2009·6 cites·11 claims
- 2270US9252100B2Multiple-patterned semiconductor device channelsIBM·Filed 2013·Granted Feb 2, 2016·2 cites·11 claims
- 2370US9082624B2Signal path of a multiple-patterned semiconductor deviceIBM·Filed 2013·Granted Jul 14, 2015·2 cites·12 claims
- 2468US8138054B2Enhanced field effect transistorALLEN DAVID HOWARD·Filed 2009·Granted Mar 20, 2012·5 cites·4 claims
- 2568US7532057B2Electrically programmable fuse sense circuitIBM·Filed 2007·Granted May 12, 2009·4 cites·4 claims
- 2665US6628126B2Optical voltage measurement circuit and method for monitoring voltage supplies utilizing imaging circuit analysisIBM·Filed 2001·Granted Sep 30, 2003·11 cites·24 claims
- 2765US6232799B1Method and apparatus for selectively controlling weak feedback in regenerative pass gate logic circuitsIBM·Filed 1999·Granted May 15, 2001·18 cites·12 claims
- 2864US9111935B2Multiple-patterned semiconductor device channelsIBM·Filed 2013·Granted Aug 18, 2015·1 cites·18 claims
- 2964US9099471B2Semiconductor device channelsIBM·Filed 2013·Granted Aug 4, 2015·1 cites·20 claims
- 3064US9070751B2Semiconductor device channelsIBM·Filed 2013·Granted Jun 30, 2015·1 cites·20 claims
- 3163US4771251ARing oscillatorCONTROL DATA CORP·Filed 1987·Granted Sep 13, 1988·18 cites·6 claims
- 3262US6001655AMethod and system for estimating the tenderness of a meat productTEXAS A & M UNIV SYS·Filed 1997·Granted Dec 14, 1999·32 cites·13 claims
- 3361US7689950B2Implementing Efuse sense amplifier testing without blowing the EfuseIBM·Filed 2007·Granted Mar 30, 2010·3 cites·12 claims
- 3461US4369669ARack and pinion assemblyCAM GEARS LTD·Filed 1980·Granted Jan 25, 1983·16 cites·12 claims
- 3557US9093451B2Signal path and method of manufacturing a multiple-patterned semiconductor deviceIBM·Filed 2013·Granted Jul 28, 2015·0 cites·6 claims
- 3657US7672185B2Method and apparatus to monitor circuit variation effects on electrically programmable fusesIBM·Filed 2007·Granted Mar 2, 2010·3 cites·20 claims
- 3756US9099462B2Signal path and method of manufacturing a multiple-patterned semiconductor deviceIBM·Filed 2013·Granted Aug 4, 2015·0 cites·11 claims
- 3856US5910735AMethod and apparatus for safe mode in dynamic logic using dram cellIBM·Filed 1997·Granted Jun 8, 1999·13 cites·19 claims
- 3956US2009006524A1Method for providing user feedback to content provider during delayed playback media files on portable playerIBM·Filed 2007·Application pending·0 cites
- 4055US9087879B2Method of making semiconductor device with distinct multiple-patterned conductive tracks on a same levelIBM·Filed 2014·Granted Jul 21, 2015·0 cites·7 claims
- 4155US8866306B2Signal path and method of manufacturing a multiple-patterned semiconductor deviceIBM·Filed 2013·Granted Oct 21, 2014·0 cites·6 claims
- 4255US5911063AMethod and apparatus for single phase clock distribution with minimal clock skewIBM·Filed 1997·Granted Jun 8, 1999·29 cites·12 claims
- 4354US9099533B2Semiconductor device with distinct multiple-patterned conductive tracks on a same levelIBM·Filed 2013·Granted Aug 4, 2015·0 cites·13 claims
- 4454US7230463B2Method and apparatus for controlling transition rates on adjacent interconnectsIBM·Filed 2005·Granted Jun 12, 2007·2 cites·17 claims
- 4554US6201431B1Method and apparatus for automatically adjusting noise immunity of an integrated circuitIBM·Filed 1999·Granted Mar 13, 2001·30 cites·11 claims
- 4653US9076848B2Semiconductor device channelsIBM·Filed 2013·Granted Jul 7, 2015·0 cites·20 claims
- 4752US9105639B2Semiconductor device channelsIBM·Filed 2013·Granted Aug 11, 2015·0 cites·18 claims
- 4852US7203876B2Method and apparatus for controlling AC power during scan operations in scannable latchesIBM·Filed 2004·Granted Apr 10, 2007·5 cites·9 claims
- 4951US9021407B2Signal path of a multiple-patterned semiconductor deviceIBM·Filed 2013·Granted Apr 28, 2015·0 cites·8 claims
- 5051US8219261B2Fan speed control from thermal diode measurementSINGH DEEPAK K·Filed 2010·Granted Jul 10, 2012·0 cites·5 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →