Inventor · disambiguated record
Damian W. Ashmead
Also filed as: ASHMEAD DAMIAN · ASHMEAD DAMIAN W
10 granted patents·1 pending application·58 citations·filing 2008–2022
85Inventor score
Files withTHERMO ELECTRON SCIENT INSTRUMENTS LLC7ASHMEAD DAMIAN W1COFFIN JOHN MAGIE1NANODROP TECHNOLOGIES LLC1ROBERTSON JR CHARLES W1
Top patents by PatentIndex Score
11 records- 0190US8223338B2Optical path length sensor and method for optimal absorbance measurementsROBERTSON JR CHARLES W·Filed 2009·Granted Jul 17, 2012·27 cites·16 claims
- 0288US9170191B2Motorized variable path length cell for spectroscopyCOFFIN JOHN MAGIE·Filed 2013·Granted Oct 27, 2015·9 cites·2 claims
- 0383US8730466B2Optical spectrometer with underfilled fiber optic sample interfaceASHMEAD DAMIAN W·Filed 2011·Granted May 20, 2014·10 cites·16 claims
- 0478US7623225B2Photometer with modular light emitterNANODROP TECHNOLOGIES LLC·Filed 2008·Granted Nov 24, 2009·12 cites·25 claims
- 0574US12313558B2Supercontinuum laser based web gauging systemTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2022·Granted May 27, 2025·0 cites·17 claims
- 0664US11057599B2Image analysis system and methodTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2020·Granted Jul 6, 2021·0 cites·18 claims
- 0761US10481079B2Path length calibration system and methodTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2018·Granted Nov 19, 2019·0 cites·13 claims
- 0857US10630951B2Image analysis system and methodTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2016·Granted Apr 21, 2020·0 cites·23 claims
- 0957US2024192147A1Nano and Microscale Patterned Surfaces for Centering a DropletTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2022·Application pending·0 cites
- 1054US9952139B2Path length calibration system and methodTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2016·Granted Apr 24, 2018·0 cites·20 claims
- 1154US9952138B2Motorized variable path length cell for spectroscopyTHERMO ELECTRON SCIENT INSTRUMENTS LLC·Filed 2015·Granted Apr 24, 2018·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →