Inventor · disambiguated record
Daisuke Bizen
Also filed as: BIZEN DAISUKE
20 granted patents·7 pending applications·24 citations·filing 2011–2024
89Inventor score
Top patents by PatentIndex Score
27 records- 0191US11011348B2Scanning electron microscope and sample observation method using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted May 18, 2021·8 cites·12 claims
- 0284US9336984B2Charged particle beam device and measuring method using the sameHITACHI HIGH TECH CORP·Filed 2014·Granted May 10, 2016·6 cites·9 claims
- 0382US9966225B2Charged particle beam device, simulation method, and simulation deviceHITACHI LTD·Filed 2014·Granted May 8, 2018·5 cites·13 claims
- 0480US11211226B2Pattern cross-sectional shape estimation system and programHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 28, 2021·1 cites·5 claims
- 0577US9520266B2Pattern critical dimension measurement equipment and method for measuring pattern critical dimensionHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 13, 2016·4 cites·20 claims
- 0674US2024363306A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0774US2025327663A1Pattern Measurement Method, Measurement System, and Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0861US11610756B2Charged particle beam apparatus and control methodHITACHI HIGH TECH CORP·Filed 2021·Granted Mar 21, 2023·0 cites·12 claims
- 0955US11456150B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Sep 27, 2022·0 cites·5 claims
- 1054US2022216032A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1152US2025232944A1Multipole lens and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1251US11211224B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Dec 28, 2021·0 cites·12 claims
- 1351US10262830B2Scanning electron microscope and electron trajectory adjustment method thereforHITACHI LTD·Filed 2014·Granted Apr 16, 2019·0 cites·12 claims
- 1451US2021404801A1Pattern Measurement Method, Measurement System, and Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 1550US2024222065A1Sample image observation device and methodHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1649US11869745B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 9, 2024·0 cites·7 claims
- 1749US10338367B2Scanning microscope with controlled variable measurement parametersHITACHI LTD·Filed 2017·Granted Jul 2, 2019·0 cites·12 claims
- 1848US12406826B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 2, 2025·0 cites·15 claims
- 1947US11164720B2Scanning electron microscope and calculation method for three-dimensional structure depthHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 2, 2021·0 cites·15 claims
- 2047US10825649B2Electron beam deviceHITACHI LTD·Filed 2019·Granted Nov 3, 2020·0 cites·9 claims
- 2146US12505976B2Charged particle beam apparatus and method for calculating roughness indexHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 23, 2025·0 cites·14 claims
- 2244US12181513B2Inspection methodHITACHI HIGH TECH CORP·Filed 2020·Granted Dec 31, 2024·0 cites·12 claims
- 2343US12191111B2Charged particle beam system and method for determining observation conditions in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 7, 2025·0 cites·16 claims
- 2443US10217604B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 26, 2019·0 cites·15 claims
- 2542US2013292568A1Scanning electron microscope and length measuring method using the sameBIZEN DAISUKE·Filed 2011·Application pending·0 cites
- 2639US11282671B2Charged-particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Mar 22, 2022·0 cites·11 claims
- 2735US10014160B2Scanning electron microscope and method for controlling sameHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 3, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →