Inventor · disambiguated record

Daniel Boecker

Also filed as: BOECKER DANIEL

1 granted patent·0 citations·filing 2022–2022

4Inventor score

Technology areasH10P

Files withCARL ZEISS MULTISEM GMBH1

Top patents by PatentIndex Score

1 record

0147US12272519B2Method for area-wise inspecting a sample via a multi-beam particle microscope, computer program product and multi-beam particle microscope for semiconductor sample inspection, and its useCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Apr 8, 2025·0 cites·24 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →