Inventor · disambiguated record
David T. Crook
Also filed as: CROOK DAVID · CROOK DAVID T
31 granted patents·1,182 citations·filing 1985–2016
98Inventor score
Files withHEWLETT PACKARD CO10AGILENT TECHNOLOGIES INC9ANALOG DEVICES INC9CROOK DAVID T1DELAVAL HOLDINGS AB1
Top patents by PatentIndex Score
31 records- 0198US5274336ACapacitively-coupled test probeHEWLETT PACKARD CO·Filed 1992·Granted Dec 28, 1993·210 cites·16 claims
- 0293US6930494B2Capacitive probe assembly with flex circuitAGILENT TECHNOLOGIES INC·Filed 2003·Granted Aug 16, 2005·61 cites·10 claims
- 0391US5469064AElectrical assembly testing using robotic positioning of probesHEWLETT PACKARD CO·Filed 1993·Granted Nov 21, 1995·88 cites·21 claims
- 0490US5530444ADifferential amplifiers which can form a residue amplifier in sub-ranging A/D convertersANALOG DEVICES INC·Filed 1995·Granted Jun 25, 1996·94 cites·33 claims
- 0589US5498964ACapacitive electrode system for detecting open solder joints in printed circuit assembliesHEWLETT PACKARD CO·Filed 1994·Granted Mar 12, 1996·71 cites·10 claims
- 0688US5557209AIdentification of pin-open faults by capacitive coupling through the integrated circuit packageHEWLETT PACKARD CO·Filed 1995·Granted Sep 17, 1996·80 cites·19 claims
- 0788US5254953AIdentification of pin-open faults by capacitive coupling through the integrated circuit packageHEWLETT PACKARD CO·Filed 1992·Granted Oct 19, 1993·111 cites·21 claims
- 0883US5898325ADual tunable direct digital synthesizer with a frequency programmable clock and method of tuningANALOG DEVICES INC·Filed 1997·Granted Apr 27, 1999·43 cites·16 claims
- 0980US5696451AIdentification of pin-open faults by capacitive couplingHEWLETT PACKARD CO·Filed 1992·Granted Dec 9, 1997·44 cites·25 claims
- 1080US5381417ACircuit testing systemHEWLETT PACKARD CO·Filed 1993·Granted Jan 10, 1995·56 cites·15 claims
- 1179US6529019B1Multiple axis magnetic test for open integrated circuit pinsAGILENT TECHNOLOGIES INC·Filed 2000·Granted Mar 4, 2003·22 cites·12 claims
- 1277US7492170B2Probe based information storage for probes used for opens detection in in-circuit testingAGILENT TECHNOLOGIES INC·Filed 2006·Granted Feb 17, 2009·7 cites·11 claims
- 1377US6549079B1Feedback systems for enhanced oscillator switching timeANALOG DEVICES INC·Filed 2001·Granted Apr 15, 2003·23 cites·14 claims
- 1475US7109728B2Probe based information storage for probes used for opens detection in in-circuit testingAGILENT TECHNOLOGIES INC·Filed 2003·Granted Sep 19, 2006·16 cites·15 claims
- 1575US5703519ADrive circuit and method for controlling the cross point levels of a differential CMOS switch drive signalANALOG DEVICES INC·Filed 1996·Granted Dec 30, 1997·32 cites·27 claims
- 1673US7957920B2Milking machine testingDELAVAL HOLDINGS AB·Filed 2006·Granted Jun 7, 2011·6 cites·22 claims
- 1770US5625292ASystem for measuring the integrity of an electrical contactHEWLETT PACKARD CO·Filed 1993·Granted Apr 29, 1997·31 cites·28 claims
- 1870US5479119AHigh speed active overvoltage detection and protection for overvoltage sensitive circuitsANALOG DEVICES INC·Filed 1994·Granted Dec 26, 1995·27 cites·20 claims
- 1967US6636061B1Method and apparatus for configurable hardware augmented program generationAGILENT TECHNOLOGIES INC·Filed 2002·Granted Oct 21, 2003·11 cites·4 claims
- 2067US6621354B1Feedback methods and systems for rapid switching of oscillator frequenciesANALOG DEVICES INC·Filed 2001·Granted Sep 16, 2003·23 cites·30 claims
- 2165US6901336B2Method and apparatus for supplying power, and channeling analog measurement and communication signals over single pair of wiresAGILENT TECHNOLOGIES INC·Filed 2003·Granted May 31, 2005·10 cites·16 claims
- 2265US6876214B2Method and apparatus for configurable hardware augmented program generationAGILENT TECHNOLOGIES INC·Filed 2003·Granted Apr 5, 2005·9 cites·8 claims
- 2364US7026846B1Synthesizer structures and methods that reduce spurious signalsANALOG DEVICES INC·Filed 2004·Granted Apr 11, 2006·13 cites·20 claims
- 2463US6522206B1Adaptive feedback-loop controllers and methods for rapid switching of oscillator frequenciesANALOG DEVICES INC·Filed 2001·Granted Feb 18, 2003·19 cites·31 claims
- 2560US5661422AHigh speed saturation prevention for saturable circuit elementsANALOG DEVICES INC·Filed 1995·Granted Aug 26, 1997·22 cites·20 claims
- 2656US10006863B2Adjustment of measurement system componentsHACH CO·Filed 2016·Granted Jun 26, 2018·0 cites·12 claims
- 2756US6377901B1Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test timeAGILENT TECHNOLOGIES INC·Filed 1999·Granted Apr 23, 2002·21 cites·18 claims
- 2852US4801878AIn-circuit transistor beta test and methodHEWLETT PACKARD CO·Filed 1987·Granted Jan 31, 1989·12 cites·17 claims
- 2944US9329054B2Adjustment of measurement system componentsCROOK DAVID T·Filed 2012·Granted May 3, 2016·0 cites·20 claims
- 3037US6324486B1Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-timeAGILENT TECHNOLOGIES INC·Filed 1999·Granted Nov 27, 2001·12 cites·20 claims
- 3136US4799023ACircuits and apparatus which enable elimination of setup time and hold time testing errorsHEWLETT PACKARD CO·Filed 1985·Granted Jan 17, 1989·8 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →