Inventor · disambiguated record
David Disterheft
Also filed as: DISTERHEFT DAVID
0 granted patents·2 pending applications·0 citations·filing 2024–2024
Technology areasH01J
Files withCARL ZEISS MULTISEM GMBH2
Top patents by PatentIndex Score
2 records- 0163US2024203684A1Method for analyzing disturbing influences in a multi-beam particle microscope, associated computer program product and multi-beam particle microscopeCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 0262US2024402104A1Multi-beam particle microscope for reducing particle beam-induced traces on a sampleCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when David Disterheft files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →