Inventor · disambiguated record
David H. Eppes
Also filed as: EPPES DAVID · EPPES DAVID H · EPPES DAVID HARRY
15 granted patents·190 citations·filing 2000–2013
92Inventor score
Top patents by PatentIndex Score
15 records- 0196US6488405B1Flip chip defect analysis using liquid crystalADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 3, 2002·113 cites·36 claims
- 0269US7259458B2Integrated circuit with increased heat transferADVANCED MICRO DEVICES INC·Filed 2005·Granted Aug 21, 2007·4 cites·18 claims
- 0365US7091621B1Crack resistant scribe line monitor structure and method for making the sameADVANCED MICRO DEVICES INC·Filed 2004·Granted Aug 15, 2006·9 cites·10 claims
- 0464US6546513B1Data processing device test apparatus and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 8, 2003·11 cites·26 claims
- 0563US6879172B1Integrated circuit heating system and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 12, 2005·13 cites·30 claims
- 0662US9318464B2Variable temperature solders for multi-chip module packaging and repackagingEPPES DAVID H·Filed 2013·Granted Apr 19, 2016·2 cites·13 claims
- 0760US6844928B1Fiber optic semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 18, 2005·3 cites·19 claims
- 0858US6599762B1Defect detection using liquid crystal and internal heat sourceADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 29, 2003·6 cites·43 claims
- 0958US6576195B1Time-lapsed IC defect analysis using liquid crystalADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 10, 2003·2 cites·23 claims
- 1057US6836132B1High resolution heat exchangeADVANCE MICRO DEVICES INC·Filed 2002·Granted Dec 28, 2004·5 cites·20 claims
- 1153US6700659B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 2, 2004·6 cites·33 claims
- 1252US6956385B1Integrated circuit defect analysis using liquid crystalADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 18, 2005·3 cites·24 claims
- 1350US6815965B1Integrated circuit internal heating system and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 9, 2004·6 cites·31 claims
- 1448US6635839B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 21, 2003·4 cites·23 claims
- 1547US6870379B1Indirect stimulation of an integrated circuit dieADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 22, 2005·3 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →