Inventor · disambiguated record
David Flannery
Also filed as: FLANNERY DAVID · FLANNERY DAVID L
5 granted patents·1 pending application·85 citations·filing 1995–2001
81Inventor score
Top patents by PatentIndex Score
6 records- 0181US5737090ASystem and method for focusing, imaging and measuring areas on a workpiece engraved by an engraverOHIO ELECTRONIC ENGRAVERS INC·Filed 1995·Granted Apr 7, 1998·46 cites·55 claims
- 0256US5671063AError tolerant method and system for measuring features of engraved areasOHIO ELECTRONIC ENGRAVERS INC·Filed 1995·Granted Sep 23, 1997·18 cites·34 claims
- 0338US6614558B1Engraver and method for focusing and measuring areas on a workpiece engraved by the engraverMDC MAX DAETWYLER AG·Filed 1998·Granted Sep 2, 2003·7 cites·33 claims
- 0437US6348979B1Engraving system and method comprising improved imagingMDC MAX DAETWYLER AG·Filed 1998·Granted Feb 19, 2002·10 cites·130 claims
- 0536US2002135811A1Error detection apparatus and method for use with engraversFiled 2001·Application pending·0 cites
- 0629US6362899B1Error detection apparatus and method for use with engraversMDC MAX DAETWYLER AG·Filed 1998·Granted Mar 26, 2002·4 cites·47 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →