Inventor · disambiguated record
Daisuke Fujisawa
Also filed as: FUJISAWA DAISUKE
15 granted patents·2 pending applications·11 citations·filing 2014–2025
85Inventor score
Files withMITSUBISHI ELECTRIC CORP17
Top patents by PatentIndex Score
17 records- 0182US9157789B2Electromagnetic wave detector and electromagnetic wave detector arrayMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Oct 13, 2015·6 cites·20 claims
- 0281US10309895B2Electromagnetic wave detector and gas analysis device having dual electromagnetic wave sensors for detecting one of light in a predetermined wavelength band and predetermined polarizationMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jun 4, 2019·2 cites·19 claims
- 0373US11832942B2Biological material measuring apparatusMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Dec 5, 2023·2 cites·14 claims
- 0465US10068934B2Electromagnetic wave detector and electromagnetic wave detector arrayMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Sep 4, 2018·1 cites·21 claims
- 0558US2025216265A1Thermal infrared detector and method of producing thermal infrared detectorMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0652US11971306B2Infrared detecting deviceMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Apr 30, 2024·0 cites·12 claims
- 0750US11197614B2Biological material measuring apparatus and method of measuring biological materialMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Dec 14, 2021·0 cites·17 claims
- 0847US11304635B2Biological material measuring apparatusMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Apr 19, 2022·0 cites·20 claims
- 0946US2023187459A1Infrared sensor and method of manufacturing infrared sensorMITSUBISHI ELECTRIC CORP·Filed 2020·Application pending·0 cites
- 1045US12007137B2Infrared imaging element comprising temperature detection pixels, drive lines, signal lines, vertical scanning circuit, signal line selection circuit, and one or more read circuits, and air conditioner equipped with the sameMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Jun 11, 2024·0 cites·19 claims
- 1145US11234648B2Biological material measuring apparatusMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Feb 1, 2022·0 cites·14 claims
- 1245US10784394B2Electromagnetic wave detector and electromagnetic wave detector arrayMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Sep 22, 2020·0 cites·17 claims
- 1344US10234379B2Electromagnetic wave detector, electromagnetic wave detector array, and gas analyzing apparatusMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Mar 19, 2019·0 cites·20 claims
- 1442US11302834B2Electromagnetic wave detectorMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Apr 12, 2022·0 cites·16 claims
- 1540US10847567B2Infrared sensor device including infrared sensor substrate and signal processing circuit substrate coupled to each otherMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Nov 24, 2020·0 cites·12 claims
- 1639US11353360B2Electromagnetic wave detector, electromagnetic wave detector array, and electromagnetic wave detection methodMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Jun 7, 2022·0 cites·18 claims
- 1739US10957810B2Electromagnetic wave detector, electromagnetic wave detector array, and electromagnetic wave detection methodMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Mar 23, 2021·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →