Inventor · disambiguated record
David Ganapol
Also filed as: GANAPOL DAVID · GANAPOL DAVID L
6 granted patents·18 citations·filing 1990–2018
75Inventor score
Top patents by PatentIndex Score
6 records- 0149US10620236B2Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sitesMARVELL WORLD TRADE LTD·Filed 2018·Granted Apr 14, 2020·0 cites·20 claims
- 0239US9244107B2Heat sink blade pack for device under test testingMARVELL WORLD TRADE LTD·Filed 2013·Granted Jan 26, 2016·0 cites·18 claims
- 0337US5124644ASystem for positioning a semiconductor chip package with respect to a testing deviceVLSI TECHNOLOGY INC·Filed 1990·Granted Jun 23, 1992·9 cites·10 claims
- 0429US5537031AIntegrated circuit test jigVLSI TECHNOLOGY INC·Filed 1995·Granted Jul 16, 1996·5 cites·17 claims
- 0526US5700045AUniversal QFP tray transfer methodVLSI TECHNOLOGY INC·Filed 1996·Granted Dec 23, 1997·2 cites·6 claims
- 0625US5110628AMethod and apparatus for marking or erasing a marking on a semiconductor chip packageVLSI TECHNOLOGY INC·Filed 1990·Granted May 5, 1992·2 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →