Inventor · disambiguated record
Daniel Gealy
Also filed as: GEALY DANIEL · GEALY DANIEL F · GEALY F DANIEL
11 granted patents·56 citations·filing 2001–2018
87Inventor score
Top patents by PatentIndex Score
11 records- 0196US10008665B1Doping of selector and storage materials of a memory cellINTEL CORP·Filed 2016·Granted Jun 26, 2018·24 cites·17 claims
- 0283US6423649B2Method and apparatus for stabilizing high pressure oxidation of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 23, 2002·17 cites·71 claims
- 0371US10347831B2Doping of selector and storage materials of a memory cellINTEL CORP·Filed 2018·Granted Jul 9, 2019·2 cites·16 claims
- 0467US6522570B1System and method for inhibiting imprinting of capacitor structures of a memoryMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 18, 2003·13 cites·37 claims
- 0555US7410911B2Method for stabilizing high pressure oxidation of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2005·Granted Aug 12, 2008·0 cites·20 claims
- 0652US8673390B2Methods of making crystalline tantalum pentoxideBHAT VISHWANATH·Filed 2012·Granted Mar 18, 2014·0 cites·8 claims
- 0750US8282988B2Methods of making crystalline tantalum pentoxideBHAT VISHWANATH·Filed 2011·Granted Oct 9, 2012·0 cites·12 claims
- 0849US8450173B2Electrical components for microelectronic devices and methods of forming the sameKRISHNAN RISHIKESH·Filed 2011·Granted May 28, 2013·0 cites·14 claims
- 0946US7279435B2Apparatus for stabilizing high pressure oxidation of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 9, 2007·0 cites·70 claims
- 1044US6955996B2Method for stabilizing high pressure oxidation of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 18, 2005·0 cites·20 claims
- 1142US7282457B2Apparatus for stabilizing high pressure oxidation of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 16, 2007·0 cites·62 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →