Inventor · disambiguated record
David M. Geis
Also filed as: GEIS DAVID M
0 granted patents·2 pending applications·0 citations·filing 2019–2019
Technology areasG01N
Files withILLINOIS TOOL WORKS2
Top patents by PatentIndex Score
2 records- 0162US2019317049A1Methods and systems for providing prompted setup and inspection during non-destructive testing (ndt)ILLINOIS TOOL WORKS·Filed 2019·Application pending·0 cites
- 0243US2020326275A1Non-destructive testing (ndt) based setups with integrated light sensorsILLINOIS TOOL WORKS·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →