Inventor · disambiguated record
David Goldovsky
Also filed as: GOLDOVSKY DAVID
4 granted patents·0 citations·filing 2019–2022
52Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD4
Top patents by PatentIndex Score
4 records- 0157US11713964B1Cathodoluminescence focal scans to characterize 3D NAND CH profileAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 0246US11474437B2Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Oct 18, 2022·0 cites·18 claims
- 0345US11525777B2Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Dec 13, 2022·0 cites·20 claims
- 0443US11105740B2Optical inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →