Inventor · disambiguated record
David A. Grosch
Also filed as: GROSCH DAVID A · GROSCH DAVID ALAN
7 granted patents·65 citations·filing 1998–2016
85Inventor score
Technology areasG01R
Top patents by PatentIndex Score
7 records- 0184US8854073B2Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patternsGROSCH DAVID A·Filed 2011·Granted Oct 7, 2014·9 cites·25 claims
- 0278US7759960B2Integrated circuit testing methods using well bias modificationIBM·Filed 2008·Granted Jul 20, 2010·7 cites·24 claims
- 0376US7400162B2Integrated circuit testing methods using well bias modificationIBM·Filed 2003·Granted Jul 15, 2008·17 cites·6 claims
- 0474US7564256B2Integrated circuit testing methods using well bias modificationINTERNAT BUSINESS MACHINES COM·Filed 2008·Granted Jul 21, 2009·6 cites·2 claims
- 0572US9535113B1Diversified exerciser and acceleratorIBM·Filed 2016·Granted Jan 3, 2017·2 cites·20 claims
- 0668US7486098B2Integrated circuit testing method using well bias modificationIBM·Filed 2007·Granted Feb 3, 2009·4 cites·1 claims
- 0757US6122760ABurn in technique for chips containing different types of IC circuitryIBM·Filed 1998·Granted Sep 19, 2000·20 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →