Inventor · disambiguated record
David C. Grundy
Also filed as: GRUNDY DAVID C
26 granted patents·14 pending applications·535 citations·filing 2002–2015
97Inventor score
Top patents by PatentIndex Score
40 records- 0197US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0295US7528598B2Fastener and fitting based sensing methodsJENTEK SENSORS INC·Filed 2006·Granted May 5, 2009·27 cites·33 claims
- 0395US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0495US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0594US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0693US8237433B2Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2011·Granted Aug 7, 2012·9 cites·35 claims
- 0789US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 0889US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 0987US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 1086US8494810B2Component adaptive life managementGOLDFINE NEIL J·Filed 2010·Granted Jul 23, 2013·20 cites·23 claims
- 1186US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 1285US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 1384US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 1483US7106055B2Fabrication of samples having predetermined material conditionsJENTEK SENSORS INC·Filed 2004·Granted Sep 12, 2006·20 cites·40 claims
- 1582US7183764B2Method for inspecting a channel using a flexible sensorJENTEK SENSORS INC·Filed 2003·Granted Feb 27, 2007·20 cites·14 claims
- 1680US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 1778US8803515B2Durability enhanced and redundant embedded sensorsGOLDFINE NEIL J·Filed 2011·Granted Aug 12, 2014·3 cites·15 claims
- 1877US7526964B2Applied and residual stress measurements using magnetic field sensorsJENTEK SENSORS INC·Filed 2003·Granted May 5, 2009·19 cites·23 claims
- 1976US7095224B2Process control and damage monitoringJENTEK SENSORS INC·Filed 2004·Granted Aug 22, 2006·19 cites·37 claims
- 2075US10001457B2Performance curve generation for non-destructive testing sensorsGOLDFINE NEIL J·Filed 2012·Granted Jun 19, 2018·4 cites·14 claims
- 2173US8222897B2Test circuit with sense elements having associated and unassociated primary windingsSHEIRETOV YANKO K·Filed 2008·Granted Jul 17, 2012·8 cites·20 claims
- 2271US7812601B2Material condition assessment with eddy current sensorsJENTEK SENSORS INC·Filed 2009·Granted Oct 12, 2010·2 cites·18 claims
- 2363US9279784B2Durability enhanced and redundant embedded sensorsJENTEK SENSORS INC·Filed 2014·Granted Mar 8, 2016·0 cites·8 claims
- 2463US8981018B2Internal material condition monitoring for controlGOLDFINE NEIL J·Filed 2005·Granted Mar 17, 2015·4 cites·22 claims
- 2561US8415947B2Method for stress assessment that removes temperature effects and hysteresis on the material property measurementsSHEIRETOV YANKO K·Filed 2012·Granted Apr 9, 2013·2 cites·9 claims
- 2654US2006186880A1Automated drawing tool and method for drawing a sensor layoutSCHLICKER DARRELL E·Filed 2006·Application pending·0 cites
- 2754US2007114993A1Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 2853US2007227255A1Self-monitoring metals, alloys and materialsGOLDFINE NEIL J·Filed 2007·Application pending·0 cites
- 2952US2006244443A1Material condition assessment with eddy current sensorsGOLDFINE NEIL J·Filed 2006·Application pending·0 cites
- 3052US2004056654A1Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 3151US2005007106A1Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 3249US2015160144A1Internal material condition monitoring for controlJENTEK SENSORS INC·Filed 2015·Application pending·0 cites
- 3345US2004004475A1High throughput absolute flaw imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 3445US2003164700A1High resolution hidden damage imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 3545US2007029997A1Test circuit with drive windings and sense elementsGOLDFINE NEIL J·Filed 2006·Application pending·0 cites
- 3644US2007069720A1Material characterization with model based sensorsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 3743US2006076952A9Segmented field sensorsJENTEK SENSORS INC·Filed 2005·Application pending·0 cites
- 3840US2005017713A1Weld characterization using eddy current sensors and arraysJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 3939US2004225474A1Damage tolerance using adaptive model-based methodsJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 4037US7533575B2Quasistatic magnetic and electric field stress/strain gagesJENTEK SENSORS INC·Filed 2007·Granted May 19, 2009·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →