Inventor · disambiguated record
Daryl L. Habersetzer
Also filed as: BRUCE JEFFREY D · HABERSETZER DARYL L
38 granted patents·1 pending application·608 citations·filing 1995–2005
98Inventor score
Top patents by PatentIndex Score
39 records- 0191US5677567ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1996·Granted Oct 14, 1997·93 cites·29 claims
- 0291US5627478AApparatus for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 1995·Granted May 6, 1997·59 cites·14 claims
- 0389US6834022B2Partial array self-refreshMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 21, 2004·42 cites·37 claims
- 0487US6130834ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 10, 2000·53 cites·24 claims
- 0584US6255837B1Apparatus and method disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·18 cites·4 claims
- 0681US5894165ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 13, 1999·45 cites·8 claims
- 0778US6028799AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2000·17 cites·7 claims
- 0876US6570400B2Method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2002·Granted May 27, 2003·11 cites·11 claims
- 0976US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 1076US5689455ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 18, 1997·29 cites·7 claims
- 1175US5770480AMethod of leads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 23, 1998·35 cites·15 claims
- 1271US6255838B1Apparatus and method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·9 cites·7 claims
- 1370US6650587B2Partial array self-refreshMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 18, 2003·14 cites·49 claims
- 1469US6826071B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 30, 2004·14 cites·14 claims
- 1569US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 1668US6903991B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 7, 2005·12 cites·7 claims
- 1767US6055173ACircuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·19 cites·8 claims
- 1866US6445605B1Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·13 cites·11 claims
- 1965US6590407B2Apparatus for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 8, 2003·6 cites·5 claims
- 2064US6646459B2Method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 11, 2003·6 cites·4 claims
- 2163US5808897AIntegrated circuit device having interchangeable terminal connectionMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 15, 1998·30 cites·19 claims
- 2263US5721703AReprogrammable option select circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Feb 24, 1998·22 cites·1 claims
- 2361US6011731ACell plate regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 4, 2000·7 cites·16 claims
- 2459US6160413AApparatus and method for disabling and re-enabling access to IC test functionsMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 12, 2000·12 cites·7 claims
- 2558US6052322AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 18, 2000·6 cites·5 claims
- 2657US6661693B2Circuit for programming antifuse bitsMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·7 cites·8 claims
- 2752US6181617B1Method and apparatus for testing a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 30, 2001·2 cites·4 claims
- 2846US6188622B1Method of identifying a defect within a memory circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 13, 2001·1 cites·4 claims
- 2946US5982687AMethod of detecting leakage within a memory cell capacitorMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 9, 1999·3 cites·5 claims
- 3040US6882587B2Method of preparing to test a capacitorMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 19, 2005·0 cites·5 claims
- 3139US6600687B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 29, 2003·0 cites·1 claims
- 3239US2005201135A1Circuit for programming antifuse bitsMULLARKEY PATRICK J·Filed 2005·Application pending·0 cites
- 3338US6469944B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 22, 2002·0 cites·4 claims
- 3438US6445629B2Method of stressing a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·0 cites·1 claims
- 3538US6418071B2Method of testing a memory cellMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·0 cites·2 claims
- 3638US6353564B1Method of testing a memory arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 5, 2002·0 cites·5 claims
- 3738US6226210B1Method of detecting a short from a digit line pair to groundMICRON TECHNOLOGY INC·Filed 2000·Granted May 1, 2001·0 cites·5 claims
- 3838US6198676B1Test deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 6, 2001·0 cites·3 claims
- 3937US6026040AMethod of altering the margin affecting a memory cellMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 15, 2000·1 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →