Inventor · disambiguated record
David Hayes
Also filed as: HAYES DAVID · HAYES DAVID V
11 granted patents·2 pending applications·546 citations·filing 1985–2025
91Inventor score
Top patents by PatentIndex Score
13 records- 0194US10007115B2Placement of a computer generated display with focal plane at finite distance using optical devices and a see-through head-mounted display incorporating the sameDAQRI LLC·Filed 2015·Granted Jun 26, 2018·28 cites·28 claims
- 0294US8384999B1Optical modulesCERR LTD·Filed 2012·Granted Feb 26, 2013·403 cites·28 claims
- 0391US8988463B2Sympathetic optic adaptation for see-through displaySTONE PEREZ KATHRYN·Filed 2010·Granted Mar 24, 2015·23 cites·17 claims
- 0485USD850444SPortable computing deviceDAQRI LLC·Filed 2016·Granted Jun 4, 2019·32 cites·1 claims
- 0578US2025347921A1Display device with optical waveguide and projectorSNAP INC·Filed 2025·Application pending·0 cites
- 0676US12393036B2Display device with optical waveguide and projectorSNAP INC·Filed 2024·Granted Aug 19, 2025·0 cites·20 claims
- 0775US10520651B2Voltage adjustable near-eye optical lensSOLIDDD CORP·Filed 2017·Granted Dec 31, 2019·2 cites·20 claims
- 0873US6879289B2Apparatus for providing a controllable signal delay along a transmission linePLASMA ANTENNAS LTD·Filed 2002·Granted Apr 12, 2005·26 cites·14 claims
- 0971US7802478B2Methods and apparatus for measuring elastic modulus of non-solid ceramic materials by resonanceCORNING INC·Filed 2007·Granted Sep 28, 2010·4 cites·18 claims
- 1065US12072495B2Display device with optical waveguide and projectorSNAP INC·Filed 2021·Granted Aug 27, 2024·0 cites·20 claims
- 1153US4687563AElectrochemical machine apparatus with drill-depth and rate monitorCORNING GLASS WORKS·Filed 1985·Granted Aug 18, 1987·14 cites·13 claims
- 1251US5386195AMethod and apparatus for monitoring an electrical property of a conductive coatingCORNING INC·Filed 1993·Granted Jan 31, 1995·14 cites·22 claims
- 1347US2025085477A1Optical waveguide manufacturing methodSNAP INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →