Inventor · disambiguated record
David Hely
Also filed as: HELY DAVID
17 granted patents·1 pending application·43 citations·filing 2005–2023
91Inventor score
Files withST MICROELECTRONICS SA11UNIV NORTHERN ARIZONA2BANCEL FREDERIC1COMMISSARIAT ENERGIE ATOMIQUE1ST MICROELECTRONICS ROUSSET1
Top patents by PatentIndex Score
18 records- 0179US10289577B2System, method and computer-accessible medium for low-overhead security wrapper for memory access control of embedded systemsUNIV NEW YORK·Filed 2017·Granted May 14, 2019·3 cites·16 claims
- 0278US11531785B2PUF-based data integrityUNIV NORTHERN ARIZONA·Filed 2020·Granted Dec 20, 2022·1 cites·20 claims
- 0373US8495734B2Method and device for detecting an erroneous jump during program executionBANCEL FREDERIC·Filed 2009·Granted Jul 23, 2013·6 cites·30 claims
- 0471US7768318B2Detection of a disturbance in the state of an electronic circuit flip-flopST MICROELECTRONICS ROUSSET·Filed 2008·Granted Aug 3, 2010·5 cites·16 claims
- 0571US7577886B2Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuitST MICROELECTRONICS SA·Filed 2006·Granted Aug 18, 2009·5 cites·52 claims
- 0667US7512852B2Protecting an integrated circuit test modeST MICROELECTRONICS SA·Filed 2005·Granted Mar 31, 2009·4 cites·11 claims
- 0765US7747935B2Method and device for securing the reading of a memoryST MICROELECTRONICS SA·Filed 2007·Granted Jun 29, 2010·3 cites·18 claims
- 0865US7725786B2Protecting an integrated circuit test modeST MICROELECTRONICS SA·Filed 2009·Granted May 25, 2010·2 cites·16 claims
- 0961US7308635B2Integrated circuit comprising a test mode secured by initialization of the test modeST MICROELECTRONICS SA·Filed 2005·Granted Dec 11, 2007·2 cites·12 claims
- 1059US7921342B2Integrated circuit comprising a test mode secured by the use of an identifier, and associated methodST MICROELECTRONICS SA·Filed 2007·Granted Apr 5, 2011·3 cites·22 claims
- 1156US7694197B2Integrated circuit comprising a test mode secured by detection of the state of a control signalST MICROELECTRONICS SA·Filed 2006·Granted Apr 6, 2010·2 cites·25 claims
- 1253US7568140B2Integrated circuit having configurable cells and a secured test modeST MICROELECTRONICS SA·Filed 2006·Granted Jul 28, 2009·2 cites·11 claims
- 1353US7478293B2Method of securing the test mode of an integrated circuit via intrusion detectionST MICROELECTRONICS SA·Filed 2005·Granted Jan 13, 2009·2 cites·16 claims
- 1451US2024020422A1Process and circuit for verifying the integrity of a software applicationCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2023·Application pending·0 cites
- 1550US7484152B2Securing the test mode of an integrated circuitSTMICOELECTRONICS SA·Filed 2006·Granted Jan 27, 2009·3 cites·20 claims
- 1645US11343109B2Secure enrollment for physical unclonable function devicesUNIV NORTHERN ARIZONA·Filed 2020·Granted May 24, 2022·0 cites·18 claims
- 1741US7930605B2Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated methodST MICROELECTRONICS SA·Filed 2007·Granted Apr 19, 2011·0 cites·23 claims
- 1841US7676717B2Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuitST MICROELECTRONICS SA·Filed 2007·Granted Mar 9, 2010·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →