Inventor · disambiguated record
David L. Hofeldt
Also filed as: HOFELDT DAVID L
11 granted patents·8 pending applications·118 citations·filing 2004–2023
89Inventor score
Files with3M INNOVATIVE PROPERTIES CO103M INNOVATIVE PROPERTIES COMPANY3RIBNICK EVAN J2HOFELDT DAVID L1QIAO YI1
Top patents by PatentIndex Score
19 records- 0191US11143590B2Time-domain terahertz measurement system having a single reference surface3M INNOVATIVE PROPERTIES CO·Filed 2019·Granted Oct 12, 2021·5 cites·20 claims
- 0291US7773226B2Web inspection calibration system and related methods3M INNOVATIVE PROPERTIES CO·Filed 2008·Granted Aug 10, 2010·23 cites·11 claims
- 0391US7189983B2LED modifying apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2004·Granted Mar 13, 2007·38 cites·23 claims
- 0489US7957000B2Web inspection calibration system and related methods3M INNOVATIVE PROPERTIES CO·Filed 2010·Granted Jun 7, 2011·16 cites·10 claims
- 0584US7202490B2LED modifying apparatus and method3M INNOVATIVE PROPERTIES CO·Filed 2004·Granted Apr 10, 2007·22 cites·29 claims
- 0668US7969560B2Optical property sensor3M INNOVATIVE PROPERTIES CO·Filed 2008·Granted Jun 28, 2011·2 cites·7 claims
- 0765US9977154B2Precision control of web material having micro-replicated lens arrayHOFELDT DAVID L·Filed 2011·Granted May 22, 2018·2 cites·29 claims
- 0863US9002072B2System for detection of non-uniformities in web-based materialsTARNOWSKI CATHERINE P·Filed 2012·Granted Apr 7, 2015·5 cites·18 claims
- 0963US8965116B2Computer-aided assignment of ratings to digital samples of a manufactured web productRIBNICK EVAN J·Filed 2011·Granted Feb 24, 2015·4 cites·20 claims
- 1060US8339573B2Method and apparatus for photoimaging a substrateTHEIS DANIEL J·Filed 2009·Granted Dec 25, 2012·1 cites·7 claims
- 1157US12123700B2Methods and systems for blown film thickness measurement3M INNOVATIVE PROPERTIES COMPANY·Filed 2020·Granted Oct 22, 2024·0 cites·13 claims
- 1252US2025259296A1Systems and methods for inspecting a worksurface3M INNOVATIVE PROPERTIES COMPANY·Filed 2023·Application pending·0 cites
- 1346US2023219274A1Methods and systems for measurement and control of circumferential layer distribution in blown films3M INNOVATIVE PROPERTIES COMPANY·Filed 2021·Application pending·0 cites
- 1445US2014362371A1Sensor for measuring surface non-uniformity3M INNOVATIVE PROPERTIES CO·Filed 2012·Application pending·0 cites
- 1545US2015009301A1Method and apparatus for measuring the three dimensional structure of a surface3M INNOVATIVE PROPERTIES CO·Filed 2013·Application pending·0 cites
- 1643US2014240720A1Linewidth measurement system3M INNOVATIVE PROPERTIES CO·Filed 2012·Application pending·0 cites
- 1739US2013208978A1Continuous charting of non-uniformity severity for detecting variability in web-based materialsRIBNICK EVAN J·Filed 2011·Application pending·0 cites
- 1835US2022011238A1Method and system for characterizing surface uniformity3M INNOVATIVE PROPERTIES CO·Filed 2019·Application pending·0 cites
- 1933US2013113919A1High resolution autofocus inspection systemQIAO YI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →