Inventor · disambiguated record
Daniel G. Knierim
Also filed as: KNIERIM DANIEL G
79 granted patents·19 pending applications·751 citations·filing 1983–2024
99Inventor score
Files withTEKTRONIX INC85BARTLETT JOSIAH A5KNIERIM DANIEL G4L LIVERMORE NAT SECURITY LLC1SMITH PATRICK A1
Top patents by PatentIndex Score
98 records- 0194US11002764B2Systems and methods for synchronizing multiple test and measurement instrumentsTEKTRONIX INC·Filed 2020·Granted May 11, 2021·3 cites·20 claims
- 0294US8723530B2Signal acquisition system having reduced probe loading of a device under testTEKTRONIX INC·Filed 2013·Granted May 13, 2014·13 cites·6 claims
- 0393US7191079B2Oscilloscope having advanced triggering capabilityTEKTRONIX INC·Filed 2005·Granted Mar 13, 2007·35 cites·35 claims
- 0492US10041975B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2015·Granted Aug 7, 2018·4 cites·3 claims
- 0592US9194888B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2012·Granted Nov 24, 2015·7 cites·7 claims
- 0692US5382955AError tolerant thermometer-to-binary encoderTEKTRONIX INC·Filed 1993·Granted Jan 17, 1995·87 cites·18 claims
- 0790US10859598B1Back-drilled via attachment technique using a UV-cure conductive adhesiveTEKTRONIX INC·Filed 2019·Granted Dec 8, 2020·6 cites·20 claims
- 0890US8278940B2Signal acquisition system having a compensation digital filterBARTLETT JOSIAH A·Filed 2010·Granted Oct 2, 2012·9 cites·12 claims
- 0987US11650225B2Test and measurement devices, systems and methods associated with augmented realityTEKTRONIX INC·Filed 2021·Granted May 16, 2023·1 cites·20 claims
- 1087US4733220AThermometer-to-adjacent bindary encoderTEKTRONIX INC·Filed 1986·Granted Mar 22, 1988·49 cites·7 claims
- 1183US12493053B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2023·Granted Dec 9, 2025·0 cites·20 claims
- 1283US12313569B2Analog signal isolatorTEKTRONIX INC·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 1383US8742749B2Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingKNIERIM DANIEL G·Filed 2011·Granted Jun 3, 2014·5 cites·24 claims
- 1483US8384411B2Method and device for measuring inter-chip signalsTEKTRONIX INC·Filed 2009·Granted Feb 26, 2013·19 cites·14 claims
- 1583US4873456AHigh speed state machineTEKTRONIX INC·Filed 1988·Granted Oct 10, 1989·43 cites·16 claims
- 1682US10365300B2Trigger on final occurrenceTEKTRONIX INC·Filed 2016·Granted Jul 30, 2019·2 cites·20 claims
- 1782US9525427B1Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filterTEKTRONIX INC·Filed 2015·Granted Dec 20, 2016·4 cites·14 claims
- 1882US4586025AError tolerant thermometer-to-binary encoderTEKTRONIX INC·Filed 1985·Granted Apr 29, 1986·35 cites·5 claims
- 1980US4843309AWaveform timing alignment system for digital oscilloscopesTEKTRONIX INC·Filed 1988·Granted Jun 27, 1989·46 cites·12 claims
- 2079US11187720B2Test and measurement devices, systems, and methods associated with augmented realityTEKTRONIX INC·Filed 2018·Granted Nov 30, 2021·2 cites·21 claims
- 2179US6642741B2Electronically adjustable integrated circuit input/output termination method and apparatusTEKTRONIX INC·Filed 2001·Granted Nov 4, 2003·29 cites·20 claims
- 2279US5530454ADigital oscilloscope architecture for signal monitoring with enhanced duty cycleTEKTRONIX INC·Filed 1994·Granted Jun 25, 1996·37 cites·18 claims
- 2379US2024069094A1Test and measurement instrument accessory with reconfigurable processing componentTEKTRONIX INC·Filed 2023·Application pending·0 cites
- 2478US10996178B2Analog signal isolatorTEKTRONIX INC·Filed 2017·Granted May 4, 2021·1 cites·17 claims
- 2577US5986637ADigital oscilloscope architecture for signal monitoring with enhanced duty cycleTEKTRONIX INC·Filed 1997·Granted Nov 16, 1999·35 cites·1 claims
- 2676US12442838B2Current monitor combining a shunt resistor with a Rogowski coilTEKTRONIX INC·Filed 2023·Granted Oct 14, 2025·0 cites·23 claims
- 2776US11146280B2Digital signal processing waveform synthesis for fixed sample rate signal sourcesTEKTRONIX INC·Filed 2019·Granted Oct 12, 2021·2 cites·20 claims
- 2876US9859908B2Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filterTEKTRONIX INC·Filed 2016·Granted Jan 2, 2018·1 cites·18 claims
- 2976US8791706B2Signal acquisition system having a compensation digital filterBARTLETT JOSIAH A·Filed 2012·Granted Jul 29, 2014·3 cites·6 claims
- 3076US8456173B2Signal acquisition system having probe cable termination in a signal processing instrumentKNIERIM DANIEL G·Filed 2010·Granted Jun 4, 2013·4 cites·10 claims
- 3176US8436624B2Signal acquisition system having reduced probe loading of a device under testBARTLETT JOSIAH A·Filed 2010·Granted May 7, 2013·3 cites·12 claims
- 3276US4613950ASelf-calibrating time interval meterTEKTRONIX INC·Filed 1983·Granted Sep 23, 1986·28 cites·25 claims
- 3375US11768161B2Analog signal isolatorTEKTRONIX INC·Filed 2021·Granted Sep 26, 2023·0 cites·20 claims
- 3475US5399988AFT doubler amplifierTEKTRONIX INC·Filed 1994·Granted Mar 21, 1995·26 cites·27 claims
- 3574US11808786B2Precision, high bandwidth, switching attenuatorTEKTRONIX INC·Filed 2022·Granted Nov 7, 2023·0 cites·23 claims
- 3674US11454651B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2020·Granted Sep 27, 2022·0 cites·10 claims
- 3774US10330705B2Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2016·Granted Jun 25, 2019·2 cites·10 claims
- 3874US10145822B2Tri-mode probe with automatic skew adjustmentTEKTRONIX INC·Filed 2015·Granted Dec 4, 2018·2 cites·14 claims
- 3973US10225022B2Electro-optic sensor systemTEKTRONIX INC·Filed 2016·Granted Mar 5, 2019·2 cites·11 claims
- 4072US11815548B2Test and measurement instrument accessory with reconfigurable processing componentTEKTRONIX INC·Filed 2021·Granted Nov 14, 2023·0 cites·16 claims
- 4172US9432042B2Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2014·Granted Aug 30, 2016·4 cites·13 claims
- 4272US9306590B2Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixingTEKTRONIX INC·Filed 2014·Granted Apr 5, 2016·4 cites·19 claims
- 4372US8611436B2Wideband balun structureKNIERIM DANIEL G·Filed 2011·Granted Dec 17, 2013·3 cites·4 claims
- 4471US5012178ALow noise DAC current source topologyTRIQUINT SEMICONDUCTOR INC·Filed 1990·Granted Apr 30, 1991·29 cites·7 claims
- 4570US5627500APhase modulator having individually placed edgesTEKTRONIX INC·Filed 1995·Granted May 6, 1997·32 cites·28 claims
- 4669US8564308B2Signal acquisition system having reduced probe loading of a device under testBARTLETT JOSIAH A·Filed 2010·Granted Oct 22, 2013·2 cites·12 claims
- 4766US11619697B2Calibration of magnetic field sensor for current probeTEKTRONIX INC·Filed 2021·Granted Apr 4, 2023·0 cites·24 claims
- 4866US11372025B2Systems and methods for synchronizing multiple test and measurement instrumentsTEKTRONIX INC·Filed 2021·Granted Jun 28, 2022·0 cites·20 claims
- 4966US11249111B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2018·Granted Feb 15, 2022·0 cites·8 claims
- 5066US7652598B2Serial data analysis improvementTEKTRONIX INC·Filed 2007·Granted Jan 26, 2010·3 cites·12 claims
Showing the top 50 of 98 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →