Inventor · disambiguated record
David C. Look
Also filed as: LOOK DAVID C
5 granted patents·130 citations·filing 1988–1995
83Inventor score
Top patents by PatentIndex Score
5 records- 0177US4816755AMethod and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafersUNIV WRIGHT STATE·Filed 1988·Granted Mar 28, 1989·40 cites·27 claims
- 0271US5150042AOn-wafer Hall-effect measurement systemUS AIR FORCE·Filed 1991·Granted Sep 22, 1992·42 cites·8 claims
- 0368US4857839AMethod and apparatus for measuring average resistivity and hall-effect of semiconductor wafersUNIV WRIGHT STATE·Filed 1988·Granted Aug 15, 1989·28 cites·22 claims
- 0442US5008542AMethod and system for automated measurement of whole-wafer etch pit density in GaAsUS AIR FORCE·Filed 1989·Granted Apr 16, 1991·12 cites·11 claims
- 0534US5512999AMethod for nondestructive measurement of dislocation density in GaAsUS ARMY·Filed 1995·Granted Apr 30, 1996·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →