Inventor · disambiguated record
Daniel R. Loughmiller
Also filed as: LOUGHMILLER DANIEL R
43 granted patents·2 pending applications·1,028 citations·filing 1993–2024
98Inventor score
Top patents by PatentIndex Score
45 records- 0196US5352945AVoltage compensating delay elementMICRON SEMICONDUCTOR INC·Filed 1993·Granted Oct 4, 1994·91 cites·8 claims
- 0294US6438060B1Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 20, 2002·80 cites·20 claims
- 0394US5977763ACircuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 2, 1999·101 cites·12 claims
- 0493US6586979B2Method for noise and power reduction for digital delay linesMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 1, 2003·52 cites·33 claims
- 0592US6088282ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 11, 2000·65 cites·21 claims
- 0691US5724282ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 3, 1998·66 cites·12 claims
- 0789US6836437B2Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 28, 2004·42 cites·20 claims
- 0887US6744654B2High density dynamic ternary-CAM memory architectureMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 1, 2004·36 cites·29 claims
- 0987US6448756B1Delay line tap setting override for delay locked loop (DLL) testabilityMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 10, 2002·36 cites·36 claims
- 1087US6396300B1Circuit and method for contact pad isolationMICRON TECHNOLOGY INC·Filed 1999·Granted May 28, 2002·52 cites·5 claims
- 1185US6737897B2Power reduction for delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2002·Granted May 18, 2004·34 cites·40 claims
- 1285US6114878ACircuit for contact pad isolationMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 5, 2000·48 cites·5 claims
- 1384US7196544B2Communication device for a logic circuitMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 27, 2007·7 cites·10 claims
- 1484US6836419B2Split word line ternary CAM architectureMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 28, 2004·34 cites·67 claims
- 1580US5727001ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 10, 1998·33 cites·20 claims
- 1674US6809974B2Controller for delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·18 cites·48 claims
- 1769US6665219B2Method of reducing standby current during power down modeMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 16, 2003·13 cites·10 claims
- 1868US6377089B1Output driverMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 23, 2002·12 cites·32 claims
- 1967US7053650B2Communication device for a logic circuitMICRON TECHNOLOGY INC·Filed 2004·Granted May 30, 2006·8 cites·1 claims
- 2067US5428310AVoltage compensating delay elementMICRON SEMICONDUCTOR INC·Filed 1994·Granted Jun 27, 1995·16 cites·8 claims
- 2167US2024355367A1Temperature differential-based voltage offset controlMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2266US6266794B1Circuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 24, 2001·18 cites·20 claims
- 2365US6628144B2Circuit and method for contact pad isolationMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 30, 2003·7 cites·21 claims
- 2462US6901013B2Controller for delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2001·Granted May 31, 2005·10 cites·41 claims
- 2561US6822475B2Method for contact pad isolationMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 23, 2004·5 cites·10 claims
- 2661US6097223ADrive-current modulated output driverMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 1, 2000·15 cites·7 claims
- 2760US5615158ASense amplifier circuit for detecting degradation of digit lines and method thereofMICRON TECHNOLOGY INC·Filed 1995·Granted Mar 25, 1997·17 cites·19 claims
- 2858US12027228B2Temperature differential-based voltage offset controlMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 2, 2024·0 cites·18 claims
- 2958US6351180B1Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 26, 2002·13 cites·21 claims
- 3057US5936908ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 10, 1999·11 cites·25 claims
- 3154US6564351B2Circuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted May 13, 2003·5 cites·24 claims
- 3254US5742549ASense amplifier circuit for detecting degradation of digit lines and method thereofMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 21, 1998·12 cites·23 claims
- 3352US6229296B1Circuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted May 8, 2001·15 cites·16 claims
- 3452US2007109016A1Circuit and method for contact pad isolationLOUGHMILLER DANIEL R·Filed 2006·Application pending·0 cites
- 3550US5751158AMethod and apparatus for selectively deriving a boosted voltage exceeding an internal voltageMICRON TECHNOLOGY INC·Filed 1995·Granted May 12, 1998·9 cites·20 claims
- 3647US5872740ASystem and method for an antifuse bankMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 16, 1999·7 cites·12 claims
- 3745US5629843ASelf compensating clamp circuit and method for limiting a potential at a pump circuit nodeMICRON TECHNOLOGY INC·Filed 1996·Granted May 13, 1997·13 cites·28 claims
- 3843US7254753B2Circuit and method for configuring CAM array margin test and operationMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 7, 2007·3 cites·64 claims
- 3942US7468623B2Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 23, 2008·2 cites·22 claims
- 4042US6885238B2Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 26, 2005·2 cites·13 claims
- 4141US6946863B1Circuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 20, 2005·2 cites·55 claims
- 4241US6847534B2High density dynamic ternary-CAM memory architectureMICRON TECHNOLOGY INC·Filed 2004·Granted Jan 25, 2005·2 cites·10 claims
- 4341US6117696ACircuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 12, 2000·7 cites·22 claims
- 4440US5942000ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 24, 1999·4 cites·20 claims
- 4537US6140831AApparatus and methods selectively deriving a boosted voltage exceeding an internal voltageMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 31, 2000·5 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →