Inventor · disambiguated record
David James Megaw
Also filed as: MEGAW DAVID · MEGAW DAVID J · MEGAW DAVID JAMES
11 granted patents·1 pending application·132 citations·filing 2004–2023
90Inventor score
Top patents by PatentIndex Score
12 records- 0196US10135340B1Pass through regulation of buck-boost regulatorLINEAR TECH HOLDING LLC·Filed 2017·Granted Nov 20, 2018·21 cites·27 claims
- 0285US7969127B1Start-up circuit for a shunt regulatorNAT SEMICONDUCTOR CORP·Filed 2008·Granted Jun 28, 2011·16 cites·21 claims
- 0384US8278886B2Power FET gate charge recoveryMEGAW DAVID JAMES·Filed 2010·Granted Oct 2, 2012·9 cites·20 claims
- 0481US7746153B1Power FET gate charge recoveryNAT SEMICONDUCTOR CORP·Filed 2007·Granted Jun 29, 2010·10 cites·20 claims
- 0578US7453252B1Circuit and method for reducing reference voltage drift in bandgap circuitsNAT SEMICONDUCTOR CORP·Filed 2004·Granted Nov 18, 2008·27 cites·13 claims
- 0671US7164259B1Apparatus and method for calibrating a bandgap reference voltageNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jan 16, 2007·27 cites·21 claims
- 0756US7088146B1Apparatus and method for high-speed half-latch with low overdrive voltageNAT SEMICONDUCTOR CORP·Filed 2004·Granted Aug 8, 2006·7 cites·20 claims
- 0855US7612609B1Self-stabilizing differential load circuit with well controlled complex impedanceNAT SEMICONDUCTOR CORP·Filed 2008·Granted Nov 3, 2009·3 cites·20 claims
- 0952US7015746B1Bootstrapped bias mixer with soft start PORNAT SEMICONDUCTOR CORP·Filed 2004·Granted Mar 21, 2006·8 cites·15 claims
- 1051US2024329127A1Pin fault detection systemTEXAS INSTRUMENTS INC·Filed 2023·Application pending·0 cites
- 1144US7019590B1Self-stabilizing differential load circuit with well controlled impedanceNAT SEMICONDUCTOR CORP·Filed 2004·Granted Mar 28, 2006·4 cites·20 claims
- 1242US7642842B1System and method for providing communication of over-current protection and current mode control between multiple chips in an integrated circuitNAT SEMICONDUCTOR CORP·Filed 2006·Granted Jan 5, 2010·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →