Inventor · disambiguated record
David C. Reynolds
Also filed as: REYNOLDS DAVID C · REYNOLDS DAVID CORDER
12 granted patents·1 pending application·283 citations·filing 1986–2007
92Inventor score
Top patents by PatentIndex Score
13 records- 0188US5199054AMethod and apparatus for high resolution inspection of electronic itemsFOUR PI SYSTEMS CORP·Filed 1990·Granted Mar 30, 1993·87 cites·14 claims
- 0279US6823496B2Physical design characterization systemIBM·Filed 2002·Granted Nov 23, 2004·26 cites·12 claims
- 0371US7882469B2Automatic verification of adequate conductive return-current pathsIBM·Filed 2007·Granted Feb 1, 2011·5 cites·5 claims
- 0468US5748959AMethod of conducting asynchronous distributed collective operationsIBM·Filed 1996·Granted May 5, 1998·57 cites·13 claims
- 0565US7584077B2Physical design characterization systemIBM·Filed 2004·Granted Sep 1, 2009·11 cites·8 claims
- 0648US4731609AFast correlation of markers with graphic entitiesIBM·Filed 1986·Granted Mar 15, 1988·17 cites·3 claims
- 0747US5742499AMethod and system for dynamically selecting a communication modeIBM·Filed 1996·Granted Apr 21, 1998·22 cites·4 claims
- 0844US5862340AMethod operating in each node of a computer system providing and utilizing special records for collective communication commands to increase work efficiency at each nodeIBM·Filed 1996·Granted Jan 19, 1999·18 cites·5 claims
- 0944US5299297AMethod for enhancing three-dimensional interference checkingIBM·Filed 1988·Granted Mar 29, 1994·15 cites·2 claims
- 1044US4754267AFast point/line correlations in graphic entitiesIBM·Filed 1986·Granted Jun 28, 1988·14 cites·2 claims
- 1142US7275226B2Method of performing latch up check on an integrated circuit designIBM·Filed 2004·Granted Sep 25, 2007·0 cites·19 claims
- 1242US2009094564A1Method for rapid return path tracingBUDELL TIMOTHY W·Filed 2007·Application pending·0 cites
- 1338US5758161ATesting method for checking the completion of asynchronous distributed collective operationsIBM·Filed 1996·Granted May 26, 1998·11 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →