Inventor · disambiguated record
Daniel Rodier
Also filed as: RODIER DANIEL · RODIER DANIEL ROBERT
15 granted patents·3 pending applications·358 citations·filing 2002–2025
94Inventor score
Files withPARTICLE MEASURING SYST18
Top patents by PatentIndex Score
18 records- 0198US11428619B2Detecting nanoparticles on production equipment and surfacesPARTICLE MEASURING SYST·Filed 2021·Granted Aug 30, 2022·7 cites·30 claims
- 0298US11428617B2Slurry monitor coupling bulk size distribution and single particle detectionPARTICLE MEASURING SYST·Filed 2020·Granted Aug 30, 2022·9 cites·29 claims
- 0398US10928293B2Detecting nanoparticles on production equipment and surfacesPARTICLE MEASURING SYST·Filed 2019·Granted Feb 23, 2021·25 cites·33 claims
- 0498US10908059B2Slurry monitor coupling bulk size distribution and single particle detectionPARTICLE MEASURING SYST·Filed 2019·Granted Feb 2, 2021·20 cites·40 claims
- 0597US11946852B2Particle detection systems and methods for on-axis particle detection and/or differential detectionPARTICLE MEASURING SYST·Filed 2021·Granted Apr 2, 2024·6 cites·20 claims
- 0697US11237095B2Particle detection systems and methods for on-axis particle detection and/or differential detectionPARTICLE MEASURING SYST·Filed 2020·Granted Feb 1, 2022·18 cites·24 claims
- 0795US9808760B2Active filtration system for controlling cleanroom environmentsPARTICLE MEASURING SYST·Filed 2017·Granted Nov 7, 2017·29 cites·17 claims
- 0895US9682345B2Method of treating a cleanroom enclosurePARTICLE MEASURING SYST·Filed 2015·Granted Jun 20, 2017·28 cites·23 claims
- 0994US11268930B2Triggered sampling systems and methodsPARTICLE MEASURING SYST·Filed 2020·Granted Mar 8, 2022·12 cites·25 claims
- 1094US7208123B2Molecular contamination monitoring system and methodPARTICLE MEASURING SYST·Filed 2002·Granted Apr 24, 2007·76 cites·73 claims
- 1193US6945090B2Method and apparatus for monitoring molecular contamination of critical surfaces using coated SAWSPARTICLE MEASURING SYST·Filed 2002·Granted Sep 20, 2005·62 cites·16 claims
- 1291US11988593B2Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensionsPARTICLE MEASURING SYST·Filed 2020·Granted May 21, 2024·4 cites·27 claims
- 1389US7235214B2System and method for measuring molecular analytes in a measurement fluidPARTICLE MEASURING SYST·Filed 2003·Granted Jun 26, 2007·61 cites·21 claims
- 1488US12276592B2Particle detection via scattered light combined with incident lightPARTICLE MEASURING SYST·Filed 2021·Granted Apr 15, 2025·1 cites·20 claims
- 1574US2024230509A9Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensionsPARTICLE MEASURING SYST·Filed 2023·Application pending·0 cites
- 1668US2025216316A1Particle detection via scattered light combined with incident lightPARTICLE MEASURING SYST·Filed 2025·Application pending·0 cites
- 1765US12399114B2Modular particle counter with docking stationPARTICLE MEASURING SYST·Filed 2022·Granted Aug 26, 2025·0 cites·29 claims
- 1839US2005028593A1Method and apparatus for high sensitivity monitoring of molecular contaminationPARTICLE MEASURING SYST·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →