Inventor · disambiguated record
Daniel Rodko
Also filed as: RODKO DANIEL
19 granted patents·2 pending applications·60 citations·filing 2004–2024
92Inventor score
Top patents by PatentIndex Score
21 records- 0191US7257745B2Array self repair using built-in self test techniquesIBM·Filed 2005·Granted Aug 14, 2007·22 cites·14 claims
- 0285US10890623B1Power saving scannable latch output driverIBM·Filed 2019·Granted Jan 12, 2021·2 cites·20 claims
- 0380US7478297B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2007·Granted Jan 13, 2009·8 cites·4 claims
- 0479US9627012B1Shift register with opposite shift data and shift clock directionsIBM·Filed 2016·Granted Apr 18, 2017·5 cites·14 claims
- 0575US7305602B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2005·Granted Dec 4, 2007·8 cites·19 claims
- 0671US10593420B2Testing content addressable memory and random access memoryIBM·Filed 2018·Granted Mar 17, 2020·2 cites·11 claims
- 0770US10170199B2Testing content addressable memory and random access memoryIBM·Filed 2018·Granted Jan 1, 2019·2 cites·1 claims
- 0870US9697910B1Multi-match error detection in content addressable memory testingIBM·Filed 2016·Granted Jul 4, 2017·3 cites·18 claims
- 0969US10971242B2Sequential error capture during memory testIBM·Filed 2019·Granted Apr 6, 2021·2 cites·11 claims
- 1069US10079070B2Testing content addressable memory and random access memoryIBM·Filed 2016·Granted Sep 18, 2018·2 cites·9 claims
- 1168US10998075B2Built-in self-test for bit-write enabled memory arraysIBM·Filed 2019·Granted May 4, 2021·2 cites·20 claims
- 1261US10288684B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 14, 2019·0 cites·9 claims
- 1361US10281527B2On-chip hardware-controlled window strobingIBM·Filed 2017·Granted May 7, 2019·0 cites·16 claims
- 1458US8327207B2Memory testing systemDUFFY KEVIN J·Filed 2010·Granted Dec 4, 2012·2 cites·16 claims
- 1549US2025279148A1Reconfigurable testing of an integrated circuitIBM·Filed 2024·Application pending·0 cites
- 1647US11462295B2Microchip level shared array repairIBM·Filed 2020·Granted Oct 4, 2022·0 cites·20 claims
- 1746US7536613B2BIST address generation architecture for multi-port memoriesIBM·Filed 2004·Granted May 19, 2009·0 cites·5 claims
- 1845US11657887B2Testing bit write operation to a memory array in integrated circuitsIBM·Filed 2021·Granted May 23, 2023·0 cites·17 claims
- 1940US9983261B2Partition-able storage of test results using inactive storage elementsIBM·Filed 2016·Granted May 29, 2018·0 cites·20 claims
- 2038US7275194B2Clock duty cycle based access timer combined with standard stage clocked output registerIBM·Filed 2005·Granted Sep 25, 2007·0 cites·8 claims
- 2132US2011296259A1Testing memory arrays and logic with abist circuitryBALAKRISHNAN BARGAV·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →