Inventor · disambiguated record
Daniel V. Rowland
Also filed as: ROWLAND DANIEL V · ROWLAND DANIEL VINCENT
3 granted patents·157 citations·filing 1997–1999
76Inventor score
Files withADVANCED MICRO DEVICES INC3
Top patents by PatentIndex Score
3 records- 0184US6033922AMonitoring wafer temperature during thermal processing of wafers by measuring sheet resistance of a test waferADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 7, 2000·82 cites·3 claims
- 0280US5970313AMonitoring wafer temperature during thermal processing of wafers by measuring sheet resistance of a test waferADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 19, 1999·63 cites·15 claims
- 0346US6635501B1Low temperature cobalt silicidation process monitorADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 21, 2003·12 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →