Inventor · disambiguated record
Darren Lee Rust
Also filed as: RUST DARREN LEE
3 granted patents·9 citations·filing 2003–2005
60Inventor score
Files withNAT SEMICONDUCTOR CORP3
Top patents by PatentIndex Score
3 records- 0172US7470594B1System and method for controlling the formation of an interfacial oxide layer in a polysilicon emitter transistorNAT SEMICONDUCTOR CORP·Filed 2005·Granted Dec 30, 2008·4 cites·20 claims
- 0258US7065424B1Systems and methods that monitor re-qualification indicia associated with durable items to ensure physical process qualityNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jun 20, 2006·0 cites·22 claims
- 0353US7043317B1Semiconductor wafer fabrication furnace idle monitor and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted May 9, 2006·5 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →