Inventor · disambiguated record
Darrell E. Schlicker
Also filed as: SCHLICKER DARRELL E
45 granted patents·16 pending applications·1,253 citations·filing 1998–2014
99Inventor score
Files withJENTEK SENSORS INC48GOLDFINE NEIL J9SHEIRETOV YANKO K2SCHLICKER DARRELL E1SHEIRETOV YANKO KONSTANTINOV1
Top patents by PatentIndex Score
61 records- 0197US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0297US6657429B1Material condition assessment with spatially periodic field sensorsJENTEK SENSORS INC·Filed 2000·Granted Dec 2, 2003·116 cites·26 claims
- 0395US7528598B2Fastener and fitting based sensing methodsJENTEK SENSORS INC·Filed 2006·Granted May 5, 2009·27 cites·33 claims
- 0495US6995557B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2004·Granted Feb 7, 2006·64 cites·25 claims
- 0595US6952095B1Surface mounted and scanning spatially periodic eddy-current sensor arraysJENTEK SENSORS INC·Filed 2000·Granted Oct 4, 2005·61 cites·58 claims
- 0695US6727691B2High resolution inductive sensor arrays for material and defect characterization of weldsJENTEK SENSORS INC·Filed 2002·Granted Apr 27, 2004·67 cites·44 claims
- 0794US7451657B2Material condition monitoring with multiple sensing modesJENTEK SENSORS INC·Filed 2005·Granted Nov 18, 2008·29 cites·21 claims
- 0894US7230421B2Damage standard fabrication with attached sensorJENTEK SENSORS INC·Filed 2005·Granted Jun 12, 2007·26 cites·17 claims
- 0994US6992482B2Magnetic field sensor having a switchable drive current spatial distributionJENTEK SENSORS INC·Filed 2001·Granted Jan 31, 2006·44 cites·20 claims
- 1094US6380747B1Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation gridsJENTEK SENSORS INC·Filed 1999·Granted Apr 30, 2002·94 cites·8 claims
- 1193US8237433B2Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2011·Granted Aug 7, 2012·9 cites·35 claims
- 1293US7467057B2Material property estimation using non-orthogonal responsive databasesJENTEK SENSORS INC·Filed 2005·Granted Dec 16, 2008·16 cites·14 claims
- 1392US7348771B2Method for verifying sensor conditionJENTEK SENSORS INC·Filed 2006·Granted Mar 25, 2008·16 cites·20 claims
- 1491US7994781B2Eddy current sensor with concentric segmentsJENTEK SENSORS INC·Filed 2009·Granted Aug 9, 2011·14 cites·28 claims
- 1591US6188218B1Absolute property measurement with air calibrationJENTEK SENSORS INC·Filed 1998·Granted Feb 13, 2001·87 cites·44 claims
- 1690US7589526B2Surface mounted sensor arrays having segmented primary windingsJENTEK SENSORS INC·Filed 2007·Granted Sep 15, 2009·12 cites·17 claims
- 1789US7876094B2Magnetic field characterization of stresses and properties in materialsJENTEK SENSORS INC·Filed 2008·Granted Jan 25, 2011·9 cites·18 claims
- 1889US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 1988US7451639B2Engine blade dovetail inspectionJENTEK SENSORS INC·Filed 2007·Granted Nov 18, 2008·18 cites·23 claims
- 2088US7385392B2Eddy current sensing arrays and systemJENTEK SENSORS INC·Filed 2002·Granted Jun 10, 2008·33 cites·32 claims
- 2187US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 2287US7289913B2Local feature characterization using quasistatic electromagnetic sensorsJENTEK SENSORS INC·Filed 2005·Granted Oct 30, 2007·11 cites·14 claims
- 2386US8050883B2Material property estimation using inverse interpolationJENTEK SENSORS INC·Filed 2008·Granted Nov 1, 2011·9 cites·15 claims
- 2486US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 2585US7280940B2Segmented field dielectric sensor array for material characterizationJENTEK SENSORS INC·Filed 2006·Granted Oct 9, 2007·9 cites·28 claims
- 2685US6486673B1Segmented field dielectrometerJENTEK SENSORS INC·Filed 2000·Granted Nov 26, 2002·57 cites·19 claims
- 2784US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 2882US7183764B2Method for inspecting a channel using a flexible sensorJENTEK SENSORS INC·Filed 2003·Granted Feb 27, 2007·20 cites·14 claims
- 2981US7161350B2Method for material property monitoring with perforated, surface mounted sensorsJENTEK SENSORS INC·Filed 2003·Granted Jan 9, 2007·16 cites·6 claims
- 3080US7161351B2Hidden feature characterization using a database of sensor responsesJENTEK SENSORS INC·Filed 2004·Granted Jan 9, 2007·16 cites·29 claims
- 3180US6781387B2Inspection method using penetrant and dielectrometerJENTEK SENSORS INC·Filed 2002·Granted Aug 24, 2004·44 cites·4 claims
- 3278US8803515B2Durability enhanced and redundant embedded sensorsGOLDFINE NEIL J·Filed 2011·Granted Aug 12, 2014·3 cites·15 claims
- 3378US6798198B2Fluid supports for sensorsJENTEK SENSORS INC·Filed 2003·Granted Sep 28, 2004·13 cites·31 claims
- 3477US7526964B2Applied and residual stress measurements using magnetic field sensorsJENTEK SENSORS INC·Filed 2003·Granted May 5, 2009·19 cites·23 claims
- 3576US7095224B2Process control and damage monitoringJENTEK SENSORS INC·Filed 2004·Granted Aug 22, 2006·19 cites·37 claims
- 3675US10001457B2Performance curve generation for non-destructive testing sensorsGOLDFINE NEIL J·Filed 2012·Granted Jun 19, 2018·4 cites·14 claims
- 3773US8222897B2Test circuit with sense elements having associated and unassociated primary windingsSHEIRETOV YANKO K·Filed 2008·Granted Jul 17, 2012·8 cites·20 claims
- 3871US7812601B2Material condition assessment with eddy current sensorsJENTEK SENSORS INC·Filed 2009·Granted Oct 12, 2010·2 cites·18 claims
- 3971USRE39206EAbsolute property measurement with air calibrationJENTEK SENSORS INC·Filed 2003·Granted Jul 25, 2006·7 cites·112 claims
- 4069US9207131B2Method and apparatus for load and additional property measurementJENTEK SENSORS INC·Filed 2013·Granted Dec 8, 2015·3 cites·20 claims
- 4169US7411390B2High resolution inductive sensor arrays for UXOJENTEK SENSORS INC·Filed 2003·Granted Aug 12, 2008·25 cites·23 claims
- 4266US6144206AMagnetometer with waveform shapingJENTEK SENSORS INC·Filed 1998·Granted Nov 7, 2000·40 cites·11 claims
- 4363US9279784B2Durability enhanced and redundant embedded sensorsJENTEK SENSORS INC·Filed 2014·Granted Mar 8, 2016·0 cites·8 claims
- 4461US8415947B2Method for stress assessment that removes temperature effects and hysteresis on the material property measurementsSHEIRETOV YANKO K·Filed 2012·Granted Apr 9, 2013·2 cites·9 claims
- 4558US2012013334A1Material Property Estimation Using Inverse InterpolationSHEIRETOV YANKO KONSTANTINOV·Filed 2011·Application pending·0 cites
- 4654US2006186880A1Automated drawing tool and method for drawing a sensor layoutSCHLICKER DARRELL E·Filed 2006·Application pending·0 cites
- 4754US2007114993A1Magnetic field characterization of stresses and properties in materialsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 4853US2007227255A1Self-monitoring metals, alloys and materialsGOLDFINE NEIL J·Filed 2007·Application pending·0 cites
- 4952US2005083050A1Fluid supports for sensorsJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 5052US2006244443A1Material condition assessment with eddy current sensorsGOLDFINE NEIL J·Filed 2006·Application pending·0 cites
Showing the top 50 of 61 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →