Inventor · disambiguated record
Dan Sebban
Also filed as: SEBBAN DAN
13 granted patents·19 citations·filing 2016–2023
87Inventor score
Files withOPTIMAL PLUS LTD13
Top patents by PatentIndex Score
13 records- 0188US11402419B2Method and system for real time outlier detection and product re-binningOPTIMAL PLUS LTD·Filed 2019·Granted Aug 2, 2022·3 cites·20 claims
- 0288US9767459B1Detection of counterfeit electronic itemsOPTIMAL PLUS LTD·Filed 2016·Granted Sep 19, 2017·6 cites·30 claims
- 0386US11475187B2Augmented reliability models for design and manufacturingOPTIMAL PLUS LTD·Filed 2020·Granted Oct 18, 2022·3 cites·20 claims
- 0481US12339305B2Method and system for real time outlier detection and product re-binningOPTIMAL PLUS LTD·Filed 2023·Granted Jun 24, 2025·0 cites·12 claims
- 0580US11907095B2Methods of smart pairingOPTIMAL PLUS LTD·Filed 2021·Granted Feb 20, 2024·1 cites·20 claims
- 0679US11068478B2Augmenting reliability models for manufactured productsOPTIMAL PLUS LTD·Filed 2017·Granted Jul 20, 2021·2 cites·14 claims
- 0775US11852668B2Method and system for real time outlier detection and product re-binningOPTIMAL PLUS LTD·Filed 2022·Granted Dec 26, 2023·0 cites·18 claims
- 0875US11143689B2Method and system for data collection and analysis for semiconductor manufacturingOPTIMAL PLUS LTD·Filed 2018·Granted Oct 12, 2021·2 cites·16 claims
- 0975US11061795B2Methods of smart pairingOPTIMAL PLUS LTD·Filed 2016·Granted Jul 13, 2021·2 cites·17 claims
- 1069US11829125B2Augmenting reliability models for manufactured productsOPTIMAL PLUS LTD·Filed 2021·Granted Nov 28, 2023·0 cites·18 claims
- 1168US11852684B2Methods and systems for detecting defects on an electronic assemblyOPTIMAL PLUS LTD·Filed 2023·Granted Dec 26, 2023·0 cites·20 claims
- 1266US12079554B2Augmented reliability models for design and manufacturingOPTIMAL PLUS LTD·Filed 2022·Granted Sep 3, 2024·0 cites·20 claims
- 1353US11650250B2Methods and systems for detecting defects on an electronic assemblyOPTIMAL PLUS LTD·Filed 2019·Granted May 16, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →