Inventor · disambiguated record
Dale Shidla
Also filed as: SHIDLA DALE · SHIDLA DALE J · SHIDLA DALE JOHN
31 granted patents·6 pending applications·322 citations·filing 2002–2008
97Inventor score
Files withHEWLETT PACKARD DEVELOPMENT CO28POMARANSKI KEN G3HEWLETT PACKARD DEVELOPMENT LP1SHIDLA DALE J1
Top patents by PatentIndex Score
37 records- 0186US6995581B2Apparatus and method for detecting and rejecting high impedance failures in chip interconnectsHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Feb 7, 2006·12 cites·20 claims
- 0282US7206966B2Fault-tolerant multi-core microprocessingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Apr 17, 2007·31 cites·14 claims
- 0378US7328380B2Memory scrubbing logicHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Feb 5, 2008·27 cites·58 claims
- 0477US7484065B2Selective memory allocationHEWLETT PACKARD DEVELOPMENT CO·Filed 2004·Granted Jan 27, 2009·25 cites·29 claims
- 0577US6895353B2Apparatus and method for monitoring high impedance failures in chip interconnectsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted May 17, 2005·19 cites·20 claims
- 0676US6985826B2System and method for testing a component in a computer system using voltage marginingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jan 10, 2006·22 cites·24 claims
- 0773US7346755B2Memory quality assuranceHEWLETT PACKARD DEVELOPMENT LP·Filed 2003·Granted Mar 18, 2008·19 cites·44 claims
- 0872US7418367B2System and method for testing a cellHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Aug 26, 2008·17 cites·20 claims
- 0971US7493534B2Memory error rankingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Feb 17, 2009·19 cites·29 claims
- 1071US7415700B2Runtime quality verification of execution unitsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Aug 19, 2008·16 cites·23 claims
- 1171US7146530B2Targeted fault tolerance by special CPU instructionsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Dec 5, 2006·15 cites·21 claims
- 1270US6879173B2Apparatus and method for detecting and rejecting high impedance failures in chip interconnectsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Apr 12, 2005·12 cites·20 claims
- 1369US6940288B2Apparatus and method for monitoring and predicting failures in system interconnectHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Sep 6, 2005·13 cites·21 claims
- 1468US7213170B2Opportunistic CPU functional testing with hardware compareHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted May 1, 2007·13 cites·17 claims
- 1564US7348498B2Partially voided anti-padsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Mar 25, 2008·11 cites·35 claims
- 1663US7586946B2Method and apparatus for automatically evaluating and allocating resources in a cell based systemHEWLETT PACKARD DEVELOPMENT CO·Filed 2005·Granted Sep 8, 2009·2 cites·15 claims
- 1763US7206969B2Opportunistic pattern-based CPU functional testingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Apr 17, 2007·8 cites·13 claims
- 1860US7141742B2Alternating voided areas of anti-padsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Nov 28, 2006·9 cites·31 claims
- 1959US6933853B2Apparatus and method for detecting and communicating interconnect failuresHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Aug 23, 2005·8 cites·12 claims
- 2055US6919813B2Built-in circuitry and method to test connector loadingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jul 19, 2005·6 cites·21 claims
- 2154US7581210B2Compiler-scheduled CPU functional testingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Aug 25, 2009·3 cites·10 claims
- 2253US8812781B2External state cache for computer processorPOMARANSKI KEN G·Filed 2005·Granted Aug 19, 2014·1 cites·16 claims
- 2352US7613961B2CPU register diagnostic testingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Nov 3, 2009·2 cites·13 claims
- 2452US7487399B2System and method for testing a component in a computer system using frequency marginingHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Feb 3, 2009·2 cites·18 claims
- 2551US7246222B2Processor type determination based on reset vector characteristicsHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jul 17, 2007·2 cites·21 claims
- 2647US7979739B2Systems and methods for managing a redundant management moduleHEWLETT PACKARD DEVELOPMENT CO·Filed 2008·Granted Jul 12, 2011·0 cites·19 claims
- 2746US8176250B2System and method for testing a memorySHIDLA DALE J·Filed 2003·Granted May 8, 2012·2 cites·19 claims
- 2846US7072788B2System and method for testing an interconnect in a computer systemHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jul 4, 2006·0 cites·17 claims
- 2945US7350109B2System and method for testing a memory using DMAHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Mar 25, 2008·4 cites·20 claims
- 3041US2004123070A1Automatic detection of different microprocessor architecturesFiled 2002·Application pending·0 cites
- 3140US7797134B2System and method for testing a memory with an expansion card using DMAHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Sep 14, 2010·2 cites·20 claims
- 3240US2004246008A1Apparatus and method for detecting and rejecting high impedance interconnect failures in manufacturing processFiled 2003·Application pending·0 cites
- 3337US2007088979A1Hardware configurable CPU with high availability modePOMARANSKI KEN G·Filed 2005·Application pending·0 cites
- 3437US2006233204A1Redundant I/O interface managementPOMARANSKI KEN G·Filed 2005·Application pending·0 cites
- 3536US7469370B2Enabling multiple testing devicesHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Dec 23, 2008·0 cites·27 claims
- 3636US2005024220A1Built-in circuitry and method to test connectivity to integrated circuitFiled 2003·Application pending·0 cites
- 3736US2004249585A1Apparatus and method for detecting high impedance failures in system interconnectFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →