Inventor · disambiguated record
Daniel L. Stone
Also filed as: STONE DANIEL · STONE DANIEL L
14 granted patents·1 pending application·130 citations·filing 2000–2002
92Inventor score
Files withADVANCED MICRO DEVICES INC15
Top patents by PatentIndex Score
15 records- 0188US6850081B1Semiconductor die analysis via fiber optic communicationADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 1, 2005·37 cites·7 claims
- 0280US6403388B1Nanomachining method for integrated circuitsADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 11, 2002·23 cites·20 claims
- 0370US6500699B1Test fixture for future integrationADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 31, 2002·14 cites·21 claims
- 0465US6448095B1Circuit access and analysis for a SOI flip-chip dieADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 10, 2002·9 cites·20 claims
- 0560US6864972B1IC die analysis via back side lensADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 8, 2005·2 cites·20 claims
- 0660US6844928B1Fiber optic semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 18, 2005·3 cites·19 claims
- 0757US6621281B1SOI die analysis of circuitry logic states via coupling through the insulatorADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 16, 2003·7 cites·21 claims
- 0857US6518783B1Circuit construction in back side of die and over a buried insulatorADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 11, 2003·7 cites·22 claims
- 0957US6414335B1Selective state change analysis of a SOI dieADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 2, 2002·7 cites·20 claims
- 1053US6700659B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 2, 2004·6 cites·33 claims
- 1153US6576484B1IC die analysis via back side circuit construction with heat dissipationADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 10, 2003·5 cites·20 claims
- 1250US7019511B1Optical analysis of integrated circuitsADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 28, 2006·4 cites·9 claims
- 1348US6635839B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 21, 2003·4 cites·23 claims
- 1444US6448096B1Atomic force microscopy and signal acquisition via buried insulatorADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 10, 2002·2 cites·24 claims
- 1535US2002084792A1SOI die analysis of circuitry logic states via coupling through the insulatorADVANCED MICRO DEVICES INC·Filed 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →