Inventor · disambiguated record

David Sturdevant

Also filed as: STURDEVANT DAVID

2 granted patents·10 citations·filing 2005–2007

56Inventor score

Technology areasH10W

Files withLSI CORP2

Top patents by PatentIndex Score

2 records

0172US7258953B2Multi-layer registration and dimensional test mark for scatterometrical measurementLSI CORP·Filed 2005·Granted Aug 21, 2007·8 cites·11 claims
0256US7492049B2Multi-layer registration and dimensional test mark for scatterometrical measurementLSI CORP·Filed 2007·Granted Feb 17, 2009·2 cites·7 claims

Join the waitlist — get patent alerts

Get an alert when David Sturdevant files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →