Inventor · disambiguated record
David Hung-I Su
Also filed as: SU DAVID HUNG-I
4 granted patents·4 citations·filing 2017–2021
63Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD4
Top patents by PatentIndex Score
4 records- 0177US10883820B2Apparatus and method for metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 5, 2021·2 cites·19 claims
- 0273US10679820B2Inspection method for wafer or DUTTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 9, 2020·2 cites·20 claims
- 0363US11525668B2Apparatus and method for metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 13, 2022·0 cites·20 claims
- 0447US10141158B2Wafer and DUT inspection apparatus and method using thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Nov 27, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →