Inventor · disambiguated record
Dan Vacar
Also filed as: VACAR DAN
17 granted patents·2 pending applications·137 citations·filing 2005–2009
93Inventor score
Top patents by PatentIndex Score
19 records- 0193US7577542B2Method and apparatus for dynamically adjusting the resolution of telemetry signalsSUN MICROSYSTEMS INC·Filed 2007·Granted Aug 18, 2009·28 cites·21 claims
- 0289US7162393B1Detecting degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2005·Granted Jan 9, 2007·23 cites·21 claims
- 0388US7330325B2Proactive fault monitoring of disk drives through phase-sensitive surveillanceSUN MICROSYSTEMS INC·Filed 2006·Granted Feb 12, 2008·8 cites·27 claims
- 0486US7184932B1Reliability prediction for complex componentsSUN MICROSYSTEMS INC·Filed 2006·Granted Feb 27, 2007·17 cites·20 claims
- 0582US7870440B2Method and apparatus for detecting multiple anomalies in a cluster of componentsORACLE AMERICA INC·Filed 2008·Granted Jan 11, 2011·12 cites·23 claims
- 0681US7216062B1Characterizing degradation of components during reliability-evaluation studiesSUN MICROSYSTEMS INC·Filed 2006·Granted May 8, 2007·11 cites·20 claims
- 0779US7283919B2Determining the quality and reliability of a component by monitoring dynamic variablesSUN MICROSYSTEMS INC·Filed 2006·Granted Oct 16, 2007·9 cites·15 claims
- 0876US7353431B2Method and apparatus for proactive fault monitoring in interconnectsSUN MICROSYSTEMS INC·Filed 2006·Granted Apr 1, 2008·8 cites·18 claims
- 0969US7668696B2Method and apparatus for monitoring the health of a computer systemSUN MICROSYSTEMS INC·Filed 2007·Granted Feb 23, 2010·4 cites·19 claims
- 1067US7890278B2Characterizing the response of a device in a computer system to vibration over a frequency rangeORACLE AMERICA INC·Filed 2008·Granted Feb 15, 2011·4 cites·21 claims
- 1165US7680624B2Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signalsSUN MICROSYSTEMS INC·Filed 2007·Granted Mar 16, 2010·3 cites·15 claims
- 1258US7800385B2Apparatus and method for testing electrical interconnectsORACLE AMERICA INC·Filed 2008·Granted Sep 21, 2010·3 cites·20 claims
- 1357US7466404B1Technique for diagnosing and screening optical interconnect light sourcesSUN MICROSYSTEMS INC·Filed 2005·Granted Dec 16, 2008·3 cites·24 claims
- 1453US7982468B2Apparatus and method for testing electrical interconnects with switchesORACLE AMERICA INC·Filed 2008·Granted Jul 19, 2011·2 cites·17 claims
- 1550US8140277B2Enhanced characterization of electrical connection degradationMCELFRESH DAVID K·Filed 2009·Granted Mar 20, 2012·1 cites·17 claims
- 1649US7920986B2Surface shape metric and method to quantify the surface shape of electronic packagesORACLE AMERICA INC·Filed 2008·Granted Apr 5, 2011·1 cites·9 claims
- 1747US2009326864A1Determining the reliability of an interconnectSUN MICROSYSTEMS INC·Filed 2008·Application pending·0 cites
- 1840US9229045B2In-situ characterization of a solid-state light sourceMCELFRESH DAVID K·Filed 2008·Granted Jan 5, 2016·0 cites·14 claims
- 1936US2008061812A1Component-attach test vehicleSUN MICROSYSTEMS INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →