Inventor · disambiguated record
David Wallis
Also filed as: UHLENDORF LEGAL REPRESENTATIVE · WALLIS DAVID · WALLIS DAVID J · WALLIS DAVID JOHN
12 granted patents·6 pending applications·136 citations·filing 2000–2022
89Inventor score
Files withINFINEON TECHNOLOGIES AG4CAMBRIDGE ENTPR LTD3QINETIQ LTD3WALLIS DAVID JOHN3BRINTZINGER AXEL1
Top patents by PatentIndex Score
18 records- 0186US6709953B2Method of applying a bottom surface protective coating to a wafer, and wafer dicing methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 23, 2004·43 cites·4 claims
- 0282US6633379B2Apparatus and method for measuring the degradation of a toolSEMICONDUCTOR 300 GMBH & CO KG·Filed 2001·Granted Oct 14, 2003·26 cites·24 claims
- 0381US7323764B2Buffer structure for modifying a silicon substrateQINETIQ LTD·Filed 2004·Granted Jan 29, 2008·26 cites·15 claims
- 0478US6752694B2Apparatus for and method of wafer grindingMOTOROLA INC·Filed 2002·Granted Jun 22, 2004·19 cites·18 claims
- 0573US6907107B1Method and apparatus for the analysis of material compositionQINETIQ LTD·Filed 2000·Granted Jun 14, 2005·18 cites·34 claims
- 0661US11817315B2Zincblende structure group III-nitrideCAMBRIDGE ENTPR LTD·Filed 2022·Granted Nov 14, 2023·0 cites·9 claims
- 0755US12283794B2Polarised emission from quantum wires in cubic GaNCAMBRIDGE ENTPR LTD·Filed 2020·Granted Apr 22, 2025·0 cites·21 claims
- 0855US7390742B2Method for producing a rewiring printed circuit boardINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 24, 2008·1 cites·21 claims
- 0946US2009236542A1Optical inspectionQINETIQ LTD·Filed 2007·Application pending·0 cites
- 1044US7169647B2Connection between a semiconductor chip and an external conductor structure and method for producing itINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jan 30, 2007·2 cites·13 claims
- 1143US11302530B2Zincblende structure group III-nitrideCAMBRIDGE ENTPR LTD·Filed 2018·Granted Apr 12, 2022·0 cites·6 claims
- 1241US7235859B2Arrangement and process for protecting fuses/anti-fusesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 26, 2007·1 cites·25 claims
- 1337US2005275085A1Arrangement for reducing the electrical crosstalk on a chipBRINTZINGER AXEL·Filed 2005·Application pending·0 cites
- 1431US8575595B2P-type semiconductor devicesWALLIS DAVID JOHN·Filed 2010·Granted Nov 5, 2013·0 cites·18 claims
- 1529US2014042558A1Method of fabrication of semiconductor deviceEMENY MARTIN TREVOR·Filed 2011·Application pending·0 cites
- 1627US2002128006A1Radio frequency (RF) detector with a light emitting diode (LED) indicatorFiled 2001·Application pending·0 cites
- 1727US2012018704A1Uniaxial tensile strain in semiconductor devicesWALLIS DAVID JOHN·Filed 2010·Application pending·0 cites
- 1827US2012025168A1Strain control in semiconductor devicesWALLIS DAVID JOHN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →