Inventor · disambiguated record
Dennis M. Adderton
Also filed as: ADDERTON DENNIS M
15 granted patents·4 pending applications·653 citations·filing 1996–2009
95Inventor score
Top patents by PatentIndex Score
19 records- 0196US6637276B2Tire sensor and methodMICHELIN RECH TECH·Filed 2001·Granted Oct 28, 2003·75 cites·43 claims
- 0294US6279389B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 2000·Granted Aug 28, 2001·57 cites·5 claims
- 0393US6951143B1Three-axis sensor assembly for use in an elastomeric materialMICHELIN RECH TECH·Filed 2000·Granted Oct 4, 2005·41 cites·50 claims
- 0490US6196061B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 1998·Granted Mar 6, 2001·108 cites·32 claims
- 0590US6189374B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Feb 20, 2001·96 cites·43 claims
- 0688US6672144B2Dynamic activation for an atomic force microscope and method of use thereofVEECO INSTR INC·Filed 2001·Granted Jan 6, 2004·58 cites·14 claims
- 0788US6530266B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Mar 11, 2003·75 cites·49 claims
- 0887US6810720B2Active probe for an atomic force microscope and method of use thereofVEECO INSTR INC·Filed 2002·Granted Nov 2, 2004·28 cites·9 claims
- 0980US7920165B2Video training systemADDERTON DENNIS M·Filed 2005·Granted Apr 5, 2011·7 cites·14 claims
- 1077US7204131B2Dynamic activation for an atomic force microscope and method of use thereofVEECO INSTR INC·Filed 2006·Granted Apr 17, 2007·12 cites·4 claims
- 1176US7036357B2Dynamic activation for an atomic force microscope and method of use thereofVEECO INSTR INC·Filed 2004·Granted May 2, 2006·17 cites·14 claims
- 1276US6172506B1Capacitance atomic force microscopes and methods of operating such microscopesVEECO INSTR INC·Filed 1997·Granted Jan 9, 2001·38 cites·12 claims
- 1367US2009303179A1Kinetic InterfaceOVERHOLT DANIEL J·Filed 2009·Application pending·0 cites
- 1464US7017398B2Active probe for an atomic force microscope and method for use thereofVEECO INSTR INC·Filed 2004·Granted Mar 28, 2006·13 cites·9 claims
- 1564US6941823B1Apparatus and method to compensate for stress in a microcantileverVEECO INSTR INC·Filed 2001·Granted Sep 13, 2005·15 cites·30 claims
- 1645US2005109280A1Rapid thermal chemical vapor deposition apparatus and methodFiled 2004·Application pending·0 cites
- 1743US5874734AAtomic force microscope for measuring properties of dielectric and insulating layersFiled 1996·Granted Feb 23, 1999·13 cites·33 claims
- 1838US2004053440A1Method and apparatus of carbon nanotube fabricationFIRST NANO INC·Filed 2003·Application pending·0 cites
- 1938US2004037767A1Method and apparatus of carbon nanotube fabricationFIRST NANO INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →