Inventor · disambiguated record
Dennis Charles Dubois
Also filed as: DUBOIS DENNIS CHARLES
2 granted patents·71 citations·filing 1995–1997
67Inventor score
Technology areasG01R
Files withIBM2
Top patents by PatentIndex Score
2 records- 0179US5923181AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1997·Granted Jul 13, 1999·41 cites·7 claims
- 0271US5686843AMethods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip moduleIBM·Filed 1995·Granted Nov 11, 1997·30 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →